On-orbit experience with the Spitzer far infrared detectors

E. T. Young, George H. Rieke, M. Blaylock, J. Cadien, C. W. Engelbracht, K. D. Gordon, D. Kelly, K. Misselt, J. Morrison, J. Muzerolle, J. Stansberry, K. Y L Su, D. Fadda, D. Frayer, A. Noriega-Crespo, J. Rho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The far-infrared detectors on the Multiband Imaging Photometer for Spitzer (MIPS) represent a significant advancement in both format and sensitivity. We describe some of the operational experience since launch in August 2003. MIPS has three infrared detector arrays, a 128×128 format Si:As impurity band conduction detector operating at 24 μm, a 32×32 format Ge:Ga array operating at 70 μm and a 2×20 format stressed Ge:Ga array operating at 160 μm. Since both germanium detectors utilize conventional bulk photoconductors, they are subject to a number of non-ideal behaviors that are inherent in these types of devices when operated in ultra-low backgrounds. The principal problems are nonlinear time response, changing responsivity in a radiation environment, and flux non-linearities. We describe observing strategies that are used on MIPS to minimize the impact of these effects.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsM. Strojnik
Pages1-8
Number of pages8
Volume5883
DOIs
Publication statusPublished - 2005
EventInfrared Spaceborne Remote Sensing 2005 - San Diego, CA, United States
Duration: Aug 3 2005Aug 4 2005

Other

OtherInfrared Spaceborne Remote Sensing 2005
CountryUnited States
CitySan Diego, CA
Period8/3/058/4/05

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Young, E. T., Rieke, G. H., Blaylock, M., Cadien, J., Engelbracht, C. W., Gordon, K. D., ... Rho, J. (2005). On-orbit experience with the Spitzer far infrared detectors. In M. Strojnik (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5883, pp. 1-8). [58830P] https://doi.org/10.1117/12.625545