Optical characterization of multilayer stacks used as phase-change media of optical disk data storage

Rongguang Liang, Chubing Peng, Kenichi Nagata, Kelly Daly-Flynn, Masud Mansuripur

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

We report results of measurements of the optical constants of the dielectric layer (ZnS-SiO2), reflecting layer (aluminum-chromium alloy), and phase-change layer (GeSbTe, AgInSbTe) used as the media of phase-change optical recording. The refractive index n and the absorption coefficient k of these materials vary to some extent with the film thickness and with the film deposition environment. We report the observed variations of optical constants among samples of differing structure and among samples fabricated in different laboratories.

Original languageEnglish (US)
Pages (from-to)370-378
Number of pages9
JournalApplied Optics
Volume41
Issue number2
StatePublished - 2002

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Optical disk storage
Optical constants
optical disks
data storage
Multilayers
Optical recording
Chromium alloys
chromium alloys
Film thickness
Aluminum alloys
Refractive index
aluminum alloys
absorptivity
film thickness
recording
refractivity

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Optical characterization of multilayer stacks used as phase-change media of optical disk data storage. / Liang, Rongguang; Peng, Chubing; Nagata, Kenichi; Daly-Flynn, Kelly; Mansuripur, Masud.

In: Applied Optics, Vol. 41, No. 2, 2002, p. 370-378.

Research output: Contribution to journalArticle

Liang, Rongguang ; Peng, Chubing ; Nagata, Kenichi ; Daly-Flynn, Kelly ; Mansuripur, Masud. / Optical characterization of multilayer stacks used as phase-change media of optical disk data storage. In: Applied Optics. 2002 ; Vol. 41, No. 2. pp. 370-378.
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