Optical characterization of semiconductor microcavities by spatially resolved imaging and resonant Rayleigh scattering

M. Gurioli, F. Bogani, D. S. Wiersma, P. Roussignol, G. Cassabois, Galina Khitrova, H. Gibbs

Research output: Contribution to journalArticle

4 Scopus citations


It is shown that images of the coherent emission from microcavity (MC) surfaces can be used for the characterization of both intrinsic and extrinsic optical properties. The method allows one to overcome the well-known problem of inhomogeneous broadening due to the MC wedge. In addition, the presence of static disorder associated with dielectric fluctuations in a Bragg reflector is observed. This is also confirmed by resonant Rayleigh scattering measurement and it is attributed to misfit dislocations induced by the large thickness of the mismatched AlGaAs alloy in the Bragg mirrors.

Original languageEnglish (US)
Pages (from-to)363-367
Number of pages5
JournalPhysica Status Solidi (A) Applied Research
Issue number2
Publication statusPublished - 2002


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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