OPTICAL FEATURE EXTRACTION VIA THE RADON TRANSFORM.

Gene R. Gindi, Arthur F Gmitro

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The authors show that by first measuring the line integrals of a two-dimensional picture f(x,y) via the Radon transform, certain feature-extraction operations useful in pattern recognition may be rapidly computed. In particular, they consider these features: (1) moments of f(x,y) invariant to translation, rotation, geometric scaling and linear contrast scaling; (2) two geometric features, polar projections and convex hull, and (3) Features of the Fourier power spectrum of f(x,y) (4) the Hough transform for detection of edges. Much of the motivation for this work lies in its implementation as an electro-optical pattern recognition system. Some experimental results are shown.

Original languageEnglish (US)
Title of host publicationProceedings - International Conference on Pattern Recognition
PublisherIEEE
Pages702-704
Number of pages3
Volume2
ISBN (Print)0818605456
Publication statusPublished - 1984
Externally publishedYes

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Gindi, G. R., & Gmitro, A. F. (1984). OPTICAL FEATURE EXTRACTION VIA THE RADON TRANSFORM. In Proceedings - International Conference on Pattern Recognition (Vol. 2, pp. 702-704). IEEE.