Optical force model based on sequential ray tracing

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

We discuss how information available from ray-tracing techniques can be used to calculate optical forces and torques on particles. A general ray-trace computer code is augmented with the polarization and irradiance distributions of the illumination and Fresnel surface coefficients to give a reasonably accurate prediction of interaction with large particles out of the focal plane. Calculations of trapping location versus nonuniform illumination conditions are compared with an experiment. Other example calculations include trapping a hemispherical lens and a two-particle trap.

Original languageEnglish (US)
Pages (from-to)1642-1650
Number of pages9
JournalApplied Optics
Volume48
Issue number9
DOIs
StatePublished - Mar 20 2009

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Ray tracing
ray tracing
Lighting
illumination
trapping
Lenses
Torque
Polarization
irradiance
torque
rays
lenses
traps
computer programs
Experiments
polarization
coefficients
predictions
interactions

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Optical force model based on sequential ray tracing. / Aspnes, Eric; Milster, Thomas D; Visscher, Koen.

In: Applied Optics, Vol. 48, No. 9, 20.03.2009, p. 1642-1650.

Research output: Contribution to journalArticle

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