Optical testbed for comparative analysis of wavefront sensors

Jonathan Andrews, Scott Teare, Sergio Restaino, Christopher Wilcox, David Wick, Hai Xiao, James T Schwiegerling

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

An optical testbed has been developed for the comparative analysis of wavefront sensors based on a modified Mach Zender interferometer design. This system provides simultaneous measurements of the wavefront sensors on the same camera by using a common aberrator. The initial application for this testbed was to evaluate a Shack-Hartmann and Phase Diversity wavefront sensors referenced to a Mach-Zender interferometer. In the current configuration of the testbed, aberrations are controlled using a liquid crystal spatial light modulator, and corrected using a deformable mirror. This testbed has the added benefit of being able to train the deformable mirror against the spatial light modulator and evaluate its ability to compensate the spatial light modulator. In the paper we present results from the wavefront sensors in the optical testbed.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsD.G. Voelz, J.C. Ricklin
Pages1-7
Number of pages7
Volume5892
DOIs
StatePublished - 2005
EventFree-Space Laser Communications V - San Diego, CA, United States
Duration: Jul 31 2005Aug 2 2005

Other

OtherFree-Space Laser Communications V
CountryUnited States
CitySan Diego, CA
Period7/31/058/2/05

Fingerprint

Wavefronts
Testbeds
light modulators
deformable mirrors
sensors
Sensors
interferometers
Interferometers
Mach number
Mirrors
aberration
Aberrations
Liquid crystals
liquid crystals
cameras
Cameras
configurations
Spatial light modulators

Keywords

  • Adaptive optics
  • Interferometry
  • Phase Diversity
  • Shack-Hartmann
  • Wavefront comparison
  • Wavefront correction
  • Wavefront sensing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Andrews, J., Teare, S., Restaino, S., Wilcox, C., Wick, D., Xiao, H., & Schwiegerling, J. T. (2005). Optical testbed for comparative analysis of wavefront sensors. In D. G. Voelz, & J. C. Ricklin (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5892, pp. 1-7). [589221] https://doi.org/10.1117/12.649559

Optical testbed for comparative analysis of wavefront sensors. / Andrews, Jonathan; Teare, Scott; Restaino, Sergio; Wilcox, Christopher; Wick, David; Xiao, Hai; Schwiegerling, James T.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / D.G. Voelz; J.C. Ricklin. Vol. 5892 2005. p. 1-7 589221.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Andrews, J, Teare, S, Restaino, S, Wilcox, C, Wick, D, Xiao, H & Schwiegerling, JT 2005, Optical testbed for comparative analysis of wavefront sensors. in DG Voelz & JC Ricklin (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5892, 589221, pp. 1-7, Free-Space Laser Communications V, San Diego, CA, United States, 7/31/05. https://doi.org/10.1117/12.649559
Andrews J, Teare S, Restaino S, Wilcox C, Wick D, Xiao H et al. Optical testbed for comparative analysis of wavefront sensors. In Voelz DG, Ricklin JC, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5892. 2005. p. 1-7. 589221 https://doi.org/10.1117/12.649559
Andrews, Jonathan ; Teare, Scott ; Restaino, Sergio ; Wilcox, Christopher ; Wick, David ; Xiao, Hai ; Schwiegerling, James T. / Optical testbed for comparative analysis of wavefront sensors. Proceedings of SPIE - The International Society for Optical Engineering. editor / D.G. Voelz ; J.C. Ricklin. Vol. 5892 2005. pp. 1-7
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