Optical waveguide losses of PZT thin films with various Zr/Ti stoichiometries

G. Teowee, J. M. Boulton, E. K. Franke, S. Motakef, T. P. Alexander, T. J. Bukowski, Donald R Uhlmann

Research output: Chapter in Book/Report/Conference proceedingChapter

10 Citations (Scopus)

Abstract

Sol-gel derived PZT thin films were spincoated on Corning 7059 glass substrates and fired to temperatures ranging from 500C to 600C for 30 min. The PZT compositions consisted of PZT x/y where x/y = 0/100, 20/80, 35/65, 53/47, 65/35, 80/20 and 100/0. Only single coated films were used since multiple coatings led to higher losses. XRD was used to characterize the phase assembly of the fired films and indicated that films with higher Zr contents contained proportionally more pyrochlore; while films with higher Ti contents have higher perovskite contents. UV-VIS spectroscopy was utilized to obtain the transmission and optical properties(refractive index and extinction coefficient) via the envelope method. Waveguide losses were measured using prism coupling at the 633 nm HeNe laser wavelength. The waveguide losses in the PZT films ranged from 1. 3 to 2. 0 dB/cm. The surface texture or morphology of the films significantly affected the optical losses as striated films gave losses of 2. 7 to 3. 3 dB/cm. The relatively low losses of the PZT films, together with their high values of refractive indices (2. 1 to 2. 7) make them highly attractive as waveguides in integrated optics.

Original languageEnglish (US)
Title of host publicationIntegrated Ferroelectrics
Pages281-288
Number of pages8
Volume15
Edition1-4
StatePublished - 1997

Fingerprint

Electric losses
Optical waveguides
Stoichiometry
optical waveguides
stoichiometry
Thin films
thin films
waveguides
Refractive index
refractivity
Optical losses
Integrated optics
integrated optics
Prisms
Ultraviolet spectroscopy
Perovskite
prisms
Sol-gels
extinction
Waveguides

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics

Cite this

Teowee, G., Boulton, J. M., Franke, E. K., Motakef, S., Alexander, T. P., Bukowski, T. J., & Uhlmann, D. R. (1997). Optical waveguide losses of PZT thin films with various Zr/Ti stoichiometries. In Integrated Ferroelectrics (1-4 ed., Vol. 15, pp. 281-288)

Optical waveguide losses of PZT thin films with various Zr/Ti stoichiometries. / Teowee, G.; Boulton, J. M.; Franke, E. K.; Motakef, S.; Alexander, T. P.; Bukowski, T. J.; Uhlmann, Donald R.

Integrated Ferroelectrics. Vol. 15 1-4. ed. 1997. p. 281-288.

Research output: Chapter in Book/Report/Conference proceedingChapter

Teowee, G, Boulton, JM, Franke, EK, Motakef, S, Alexander, TP, Bukowski, TJ & Uhlmann, DR 1997, Optical waveguide losses of PZT thin films with various Zr/Ti stoichiometries. in Integrated Ferroelectrics. 1-4 edn, vol. 15, pp. 281-288.
Teowee G, Boulton JM, Franke EK, Motakef S, Alexander TP, Bukowski TJ et al. Optical waveguide losses of PZT thin films with various Zr/Ti stoichiometries. In Integrated Ferroelectrics. 1-4 ed. Vol. 15. 1997. p. 281-288
Teowee, G. ; Boulton, J. M. ; Franke, E. K. ; Motakef, S. ; Alexander, T. P. ; Bukowski, T. J. ; Uhlmann, Donald R. / Optical waveguide losses of PZT thin films with various Zr/Ti stoichiometries. Integrated Ferroelectrics. Vol. 15 1-4. ed. 1997. pp. 281-288
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