Optimization of basis functions for aperture shifting interferometric testing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Aperture shifting interferometric testing uses multiple measurements with the interferometer aperture shifted to different positions and orientations on the test optic. A maximum likelihood algorithm is used to separate errors in the reference from those in the optic under test. The analysis uses a decomposition of the data into basis functions. This paper discusses the optimal selection of these functions to provide a robust solution using minimal computational resources.

Original languageEnglish (US)
Title of host publicationOptical Fabrication and Testing, OFT 2006
PublisherOptical Society of America
ISBN (Print)1557528187, 9781557528186
StatePublished - Jan 1 2006
EventOptical Fabrication and Testing, OFT 2006 - Rochester, NY, United States
Duration: Oct 10 2006Oct 10 2006

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherOptical Fabrication and Testing, OFT 2006
Country/TerritoryUnited States
CityRochester, NY
Period10/10/0610/10/06

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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