Optimizing a multiple-pinhole spect system using the ideal observer

Kevin Gross, Matthew A Kupinski, Todd Peterson, Eric W Clarkson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

In a pinhole imaging system, multiple pinholes are potentially beneficial since more radiation will arrive in the detector plane. However, the various images produced by each pinhole may multiplex (overlap), possibly decreasing image quality. In this work we develop the framework for comparing various pinhole configurations using ideal-observer performance as a figure of merit. We compute the ideal-observer test statistic, the likelihood ratio, using a statistical method known as Markov-Chain Monte Carlo. For different imaging systems, we estimate the likelihood ratio for many realizations of noisy image data both with and without a signal present. For each imaging system, the area under the ROC curve provides a meaningful figure of merit for hardware comparison. In this work we compare different pinhole configurations using a three-dimensional lumpy object model, a known signal (SKE), and simulated pinhole imaging systems. The results of our work will eventually serve as a basis for a design of high-resolution pinhole SPECT systems.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsP. Chakraborty, E.A. Krupinski
Pages314-322
Number of pages9
Volume5034
DOIs
StatePublished - 2003
EventMedical Imaging 2003: Image Perception, Observer Performance, and Technology Assessment - San Diego, CA, United States
Duration: Feb 18 2003Feb 20 2003

Other

OtherMedical Imaging 2003: Image Perception, Observer Performance, and Technology Assessment
CountryUnited States
CitySan Diego, CA
Period2/18/032/20/03

Fingerprint

pinholes
Imaging systems
likelihood ratio
figure of merit
Markov processes
Image quality
Statistical methods
Statistics
Detectors
Hardware
Radiation
Markov chains
configurations
hardware
statistics
high resolution
detectors
curves
radiation
estimates

Keywords

  • Hardware optimization
  • Ideal observer
  • Image quality
  • Markov-Chain Monte Carlo
  • Object statistics
  • Parallel processing
  • Signal detection
  • Task based

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Gross, K., Kupinski, M. A., Peterson, T., & Clarkson, E. W. (2003). Optimizing a multiple-pinhole spect system using the ideal observer. In P. Chakraborty, & E. A. Krupinski (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5034, pp. 314-322) https://doi.org/10.1117/12.480336

Optimizing a multiple-pinhole spect system using the ideal observer. / Gross, Kevin; Kupinski, Matthew A; Peterson, Todd; Clarkson, Eric W.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / P. Chakraborty; E.A. Krupinski. Vol. 5034 2003. p. 314-322.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gross, K, Kupinski, MA, Peterson, T & Clarkson, EW 2003, Optimizing a multiple-pinhole spect system using the ideal observer. in P Chakraborty & EA Krupinski (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5034, pp. 314-322, Medical Imaging 2003: Image Perception, Observer Performance, and Technology Assessment, San Diego, CA, United States, 2/18/03. https://doi.org/10.1117/12.480336
Gross K, Kupinski MA, Peterson T, Clarkson EW. Optimizing a multiple-pinhole spect system using the ideal observer. In Chakraborty P, Krupinski EA, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5034. 2003. p. 314-322 https://doi.org/10.1117/12.480336
Gross, Kevin ; Kupinski, Matthew A ; Peterson, Todd ; Clarkson, Eric W. / Optimizing a multiple-pinhole spect system using the ideal observer. Proceedings of SPIE - The International Society for Optical Engineering. editor / P. Chakraborty ; E.A. Krupinski. Vol. 5034 2003. pp. 314-322
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