Orientational correlations in liquid crystalline systems revealed by polarization-analyzed resonant x-ray scattering

Ronald Pindak, Peter Mach, Anne Marie Levelut, Philippe Barois, Cheng Cher Huang, Lars R Furenlid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The existence of a helical symmetry axis is widespread in systems exhibiting liquid-crystalline order, especially in systems comprised of chiral molecules. Because these systems usually lack three-dimensional positional order, the helical symmetry axis cannot be observed using conventional x-ray scattering. Since the nature of the helical ordering determines the electro-optic response of the liquid crystal phases, it is a crucial structural feature to establish. Important for device applications are the various chiral smectic-C (SmC*) liquid crystal phases that are composed of fluid-like layers of tilted molecules. The electro-optic response of these phases varies from ferro to ferri to antiferroelectric. To elucidate the structure of the SmC* phases, we did resonant x-ray scattering at the sulfur K-edge on sulfur containing compounds. Our polarization-analyzed measurements of the resonant diffraction provided unambiguous evidence that the in-plane tilt direction in these phases exhibits a helical interlayer orientational ordering with a short pitch = vd where d is the layer spacing. In the lowest temperature SmC* phase, which has antiferroelectric ordering, v was close to 2. At higher temperatures, the ferrielectric phases had v = 3, then 4, and finally, an incommensurate value varying between 5 and 8 with increasing temperature.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages304-313
Number of pages10
Volume3773
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1999 X-ray Optics Design, Performance, and Applications - Denver, CO, USA
Duration: Jul 20 1999Jul 21 1999

Other

OtherProceedings of the 1999 X-ray Optics Design, Performance, and Applications
CityDenver, CO, USA
Period7/20/997/21/99

Fingerprint

x ray scattering
electro-optics
liquid crystals
Scattering
Polarization
Electrooptical effects
Crystalline materials
X rays
sulfur compounds
Liquid crystals
Liquids
symmetry
polarization
Sulfur
liquids
molecules
interlayers
Molecules
sulfur
spacing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Pindak, R., Mach, P., Levelut, A. M., Barois, P., Huang, C. C., & Furenlid, L. R. (1999). Orientational correlations in liquid crystalline systems revealed by polarization-analyzed resonant x-ray scattering. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3773, pp. 304-313). Society of Photo-Optical Instrumentation Engineers.

Orientational correlations in liquid crystalline systems revealed by polarization-analyzed resonant x-ray scattering. / Pindak, Ronald; Mach, Peter; Levelut, Anne Marie; Barois, Philippe; Huang, Cheng Cher; Furenlid, Lars R.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3773 Society of Photo-Optical Instrumentation Engineers, 1999. p. 304-313.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pindak, R, Mach, P, Levelut, AM, Barois, P, Huang, CC & Furenlid, LR 1999, Orientational correlations in liquid crystalline systems revealed by polarization-analyzed resonant x-ray scattering. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3773, Society of Photo-Optical Instrumentation Engineers, pp. 304-313, Proceedings of the 1999 X-ray Optics Design, Performance, and Applications, Denver, CO, USA, 7/20/99.
Pindak R, Mach P, Levelut AM, Barois P, Huang CC, Furenlid LR. Orientational correlations in liquid crystalline systems revealed by polarization-analyzed resonant x-ray scattering. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3773. Society of Photo-Optical Instrumentation Engineers. 1999. p. 304-313
Pindak, Ronald ; Mach, Peter ; Levelut, Anne Marie ; Barois, Philippe ; Huang, Cheng Cher ; Furenlid, Lars R. / Orientational correlations in liquid crystalline systems revealed by polarization-analyzed resonant x-ray scattering. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3773 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 304-313
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