Patterned thin water films on mica

R. K. Workman, Srinivas Manne

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

Patterned water films were formed on the surface of mica by contact with clean, patterned poly(dimethylsiloxane) stamps in ambient humidity. Capillary condensation of ambient atmospheric water in the stamp channels allowed transport of potassium from the mica surface to the stamp, which locally modified the wetability of the mica surface. The resulting mica surface was imaged with contact-mode atomic force microscopy, revealing 3 Å-tall patterns. The pattern disappeared as the relative humidity was decreased (<25% RH) but reappeared as the relative humidity was increased above ∼35%. The pattern also disappeared as the relative humidity was increased above ∼70% but again reappeared when the humidity was subsequently decreased to ∼35%. This high-humidity treatment often resulted in patterned 1 nm-tall islands on the mica surface, which are believed to be a potassium compound (possibly potassium bicarbonate). Such regularly patterned films may be useful as models of heterogeneous surfaces that can be used for fundamental wetting studies and as templated reaction spaces for aqueous materials synthesis.

Original languageEnglish (US)
Pages (from-to)661-666
Number of pages6
JournalLangmuir
Volume18
Issue number3
DOIs
StatePublished - Feb 5 2002

Fingerprint

Mica
mica
humidity
Atmospheric humidity
Water
water
Potassium
Potassium Compounds
potassium
Potassium compounds
potassium compounds
Polydimethylsiloxane
wetting
Wetting
Condensation
Atomic force microscopy
carbonates
condensation
atomic force microscopy
synthesis

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

Cite this

Patterned thin water films on mica. / Workman, R. K.; Manne, Srinivas.

In: Langmuir, Vol. 18, No. 3, 05.02.2002, p. 661-666.

Research output: Contribution to journalArticle

Workman, R. K. ; Manne, Srinivas. / Patterned thin water films on mica. In: Langmuir. 2002 ; Vol. 18, No. 3. pp. 661-666.
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