Phase-Induced Amplitude Apodization (PIAA) coronagraph testing at the high contrast imaging testbed

Brian Kern, Ruslan Belikov, Amir Give'on, Olivier Guyon, Andreas Kuhnert, Marie B. Levine-West, Ian C. McMichael, Dwight C. Moody, Albert F. Niessner, Laurent Pueyo, Stuart B. Shaklan, Wesley A. Traub, John T. Trauger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Abstract

We present the current status of our testing of a phase-induced amplitude apodization (PIAA) coronagraph at the Jet Propulsion Lab's High Contrast Imaging Testbed (HCIT) vacuum facilities. These PIAA optics were designed to produce a point-spread function containing a region whose intensity is below 10 -9 over a 20-percent fractional bandpass, comparable to the requirements for direct imaging of exoplanets from space. The results presented here show contrast levels of 4×10-7 in monochromatic light, with an inner working angle of 2.4 λ/D. The instrumentation is described here, as well as the testing procedures, wavefront control, and results.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7440
DOIs
Publication statusPublished - 2009
Externally publishedYes
EventTechniques and Instrumentation for Detection of Exoplanets IV - San Diego, CA, United States
Duration: Aug 4 2009Aug 5 2009

Other

OtherTechniques and Instrumentation for Detection of Exoplanets IV
CountryUnited States
CitySan Diego, CA
Period8/4/098/5/09

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Keywords

  • coronagraph
  • exoplanets
  • wavefront control

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Kern, B., Belikov, R., Give'on, A., Guyon, O., Kuhnert, A., Levine-West, M. B., ... Trauger, J. T. (2009). Phase-Induced Amplitude Apodization (PIAA) coronagraph testing at the high contrast imaging testbed. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7440). [74400H] https://doi.org/10.1117/12.826988