Phase-sensitive acoustic imaging and micro-metrology of polymer blend thin films

W. Ngwa, R. Wannemacher, W. Grill, Tribikram Kundu

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Scanning acoustic microscopy with vector contrast (PSAM) at 1.2 GHz is employed for three-dimensional real-space measurements of structure in PS/PMMA (polystyrene/ poly(methyl methacrylate)) blend films, spun-cast on glass and silicon substrates. Processing of the digitized phase and amplitude images yields information on the surface structure and internal structure of the blend films. The complex V(z) functions render qualitative and quantitative material contrast for each image pixel and, hence, permit the characterization of individual domains. It is shown that PSAM can provide valuable insights regarding the polymer blend film morphology and micro-mechanical properties, not acquirable by other ways.

Original languageEnglish (US)
Pages (from-to)830-836
Number of pages7
JournalEPL
Volume64
Issue number6
DOIs
StatePublished - Dec 2003

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acoustic imaging
polymer blends
metrology
thin films
polymethyl methacrylate
casts
polystyrene
pixels
mechanical properties
microscopy
scanning
acoustics
glass
silicon

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Phase-sensitive acoustic imaging and micro-metrology of polymer blend thin films. / Ngwa, W.; Wannemacher, R.; Grill, W.; Kundu, Tribikram.

In: EPL, Vol. 64, No. 6, 12.2003, p. 830-836.

Research output: Contribution to journalArticle

Ngwa, W. ; Wannemacher, R. ; Grill, W. ; Kundu, Tribikram. / Phase-sensitive acoustic imaging and micro-metrology of polymer blend thin films. In: EPL. 2003 ; Vol. 64, No. 6. pp. 830-836.
@article{dc68d8af69e7420ab0ade49b4e1f69fd,
title = "Phase-sensitive acoustic imaging and micro-metrology of polymer blend thin films",
abstract = "Scanning acoustic microscopy with vector contrast (PSAM) at 1.2 GHz is employed for three-dimensional real-space measurements of structure in PS/PMMA (polystyrene/ poly(methyl methacrylate)) blend films, spun-cast on glass and silicon substrates. Processing of the digitized phase and amplitude images yields information on the surface structure and internal structure of the blend films. The complex V(z) functions render qualitative and quantitative material contrast for each image pixel and, hence, permit the characterization of individual domains. It is shown that PSAM can provide valuable insights regarding the polymer blend film morphology and micro-mechanical properties, not acquirable by other ways.",
author = "W. Ngwa and R. Wannemacher and W. Grill and Tribikram Kundu",
year = "2003",
month = "12",
doi = "10.1209/epl/i2003-00633-9",
language = "English (US)",
volume = "64",
pages = "830--836",
journal = "Europhysics Letters",
issn = "0295-5075",
publisher = "IOP Publishing Ltd.",
number = "6",

}

TY - JOUR

T1 - Phase-sensitive acoustic imaging and micro-metrology of polymer blend thin films

AU - Ngwa, W.

AU - Wannemacher, R.

AU - Grill, W.

AU - Kundu, Tribikram

PY - 2003/12

Y1 - 2003/12

N2 - Scanning acoustic microscopy with vector contrast (PSAM) at 1.2 GHz is employed for three-dimensional real-space measurements of structure in PS/PMMA (polystyrene/ poly(methyl methacrylate)) blend films, spun-cast on glass and silicon substrates. Processing of the digitized phase and amplitude images yields information on the surface structure and internal structure of the blend films. The complex V(z) functions render qualitative and quantitative material contrast for each image pixel and, hence, permit the characterization of individual domains. It is shown that PSAM can provide valuable insights regarding the polymer blend film morphology and micro-mechanical properties, not acquirable by other ways.

AB - Scanning acoustic microscopy with vector contrast (PSAM) at 1.2 GHz is employed for three-dimensional real-space measurements of structure in PS/PMMA (polystyrene/ poly(methyl methacrylate)) blend films, spun-cast on glass and silicon substrates. Processing of the digitized phase and amplitude images yields information on the surface structure and internal structure of the blend films. The complex V(z) functions render qualitative and quantitative material contrast for each image pixel and, hence, permit the characterization of individual domains. It is shown that PSAM can provide valuable insights regarding the polymer blend film morphology and micro-mechanical properties, not acquirable by other ways.

UR - http://www.scopus.com/inward/record.url?scp=0346897783&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0346897783&partnerID=8YFLogxK

U2 - 10.1209/epl/i2003-00633-9

DO - 10.1209/epl/i2003-00633-9

M3 - Article

VL - 64

SP - 830

EP - 836

JO - Europhysics Letters

JF - Europhysics Letters

SN - 0295-5075

IS - 6

ER -