Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics

J. T. Dawley, G. Teowee, B. J J Zelinski, Donald R Uhlmann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

In this study, the use of a fiber optic technique for the measurement of the piezoelectric properties of ferroelectric bulk and thin film samples was investigated. The strain and piezoelectric properties (namely the d33 coefficients) were measured using the MTI-2000 Fotonic Sensor, which uses the principle of the optical lever to resolve very small changes in sample displacement (1 angstrom). Using this technique, we were able to detect the very small strains associated with the converse piezoelectric effect for PVDF films and bulk PZT samples, and correlate the results with data acquired from direct piezoelectric effect measurement. Comparison of the data sets prove that the optical lever would be a useful optical technique for measuring of the d33 values of ceramic thin films, such as BaTiO3, ZnO, and PZT.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Pages317-323
Number of pages7
Volume433
StatePublished - 1996
EventProceedings of the 1996 MRS Spring Symposium - San Francisco, CA, USA
Duration: Apr 7 1996Apr 12 1996

Other

OtherProceedings of the 1996 MRS Spring Symposium
CitySan Francisco, CA, USA
Period4/7/964/12/96

Fingerprint

Piezoelectricity
Fiber optics
Ferroelectric materials
Thin films
Sensors
polyvinylidene fluoride

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Dawley, J. T., Teowee, G., Zelinski, B. J. J., & Uhlmann, D. R. (1996). Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics. In Materials Research Society Symposium - Proceedings (Vol. 433, pp. 317-323). Materials Research Society.

Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics. / Dawley, J. T.; Teowee, G.; Zelinski, B. J J; Uhlmann, Donald R.

Materials Research Society Symposium - Proceedings. Vol. 433 Materials Research Society, 1996. p. 317-323.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Dawley, JT, Teowee, G, Zelinski, BJJ & Uhlmann, DR 1996, Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics. in Materials Research Society Symposium - Proceedings. vol. 433, Materials Research Society, pp. 317-323, Proceedings of the 1996 MRS Spring Symposium, San Francisco, CA, USA, 4/7/96.
Dawley JT, Teowee G, Zelinski BJJ, Uhlmann DR. Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics. In Materials Research Society Symposium - Proceedings. Vol. 433. Materials Research Society. 1996. p. 317-323
Dawley, J. T. ; Teowee, G. ; Zelinski, B. J J ; Uhlmann, Donald R. / Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics. Materials Research Society Symposium - Proceedings. Vol. 433 Materials Research Society, 1996. pp. 317-323
@inproceedings{f0f7eaf74f5f4137bd570502b620fbaa,
title = "Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics",
abstract = "In this study, the use of a fiber optic technique for the measurement of the piezoelectric properties of ferroelectric bulk and thin film samples was investigated. The strain and piezoelectric properties (namely the d33 coefficients) were measured using the MTI-2000 Fotonic Sensor, which uses the principle of the optical lever to resolve very small changes in sample displacement (1 angstrom). Using this technique, we were able to detect the very small strains associated with the converse piezoelectric effect for PVDF films and bulk PZT samples, and correlate the results with data acquired from direct piezoelectric effect measurement. Comparison of the data sets prove that the optical lever would be a useful optical technique for measuring of the d33 values of ceramic thin films, such as BaTiO3, ZnO, and PZT.",
author = "Dawley, {J. T.} and G. Teowee and Zelinski, {B. J J} and Uhlmann, {Donald R}",
year = "1996",
language = "English (US)",
volume = "433",
pages = "317--323",
booktitle = "Materials Research Society Symposium - Proceedings",
publisher = "Materials Research Society",

}

TY - GEN

T1 - Piezoelectric characterization of bulk and thin film ferroelectric materials using fiber optics

AU - Dawley, J. T.

AU - Teowee, G.

AU - Zelinski, B. J J

AU - Uhlmann, Donald R

PY - 1996

Y1 - 1996

N2 - In this study, the use of a fiber optic technique for the measurement of the piezoelectric properties of ferroelectric bulk and thin film samples was investigated. The strain and piezoelectric properties (namely the d33 coefficients) were measured using the MTI-2000 Fotonic Sensor, which uses the principle of the optical lever to resolve very small changes in sample displacement (1 angstrom). Using this technique, we were able to detect the very small strains associated with the converse piezoelectric effect for PVDF films and bulk PZT samples, and correlate the results with data acquired from direct piezoelectric effect measurement. Comparison of the data sets prove that the optical lever would be a useful optical technique for measuring of the d33 values of ceramic thin films, such as BaTiO3, ZnO, and PZT.

AB - In this study, the use of a fiber optic technique for the measurement of the piezoelectric properties of ferroelectric bulk and thin film samples was investigated. The strain and piezoelectric properties (namely the d33 coefficients) were measured using the MTI-2000 Fotonic Sensor, which uses the principle of the optical lever to resolve very small changes in sample displacement (1 angstrom). Using this technique, we were able to detect the very small strains associated with the converse piezoelectric effect for PVDF films and bulk PZT samples, and correlate the results with data acquired from direct piezoelectric effect measurement. Comparison of the data sets prove that the optical lever would be a useful optical technique for measuring of the d33 values of ceramic thin films, such as BaTiO3, ZnO, and PZT.

UR - http://www.scopus.com/inward/record.url?scp=0030402827&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030402827&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0030402827

VL - 433

SP - 317

EP - 323

BT - Materials Research Society Symposium - Proceedings

PB - Materials Research Society

ER -