Plasmonically Induced Potential in Metal–Semiconductor Composites

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Techniques such as conductive atomic force microscopy and electrostatic force microscopy are applied to the study of photoexcited arrays of gold nanoparticles decorating an indium tin oxide coated glass substrate. The nanoparticles are partially covered by a thin semiconducting polymer. The change in the current and potential profiles of the composite metal-semiconductor sample after excitation at the plasmonic resonance frequency of the metallic nanoparticles is analyzed.

Original languageEnglish (US)
Pages (from-to)1805-1810
Number of pages6
JournalAdvanced Optical Materials
Volume4
Issue number11
DOIs
StatePublished - Nov 1 2016

Fingerprint

Nanoparticles
nanoparticles
composite materials
Composite materials
Semiconducting polymers
Electrostatic force
Tin oxides
Gold
indium oxides
Indium
tin oxides
Atomic force microscopy
Microscopic examination
Metals
atomic force microscopy
electrostatics
Semiconductor materials
gold
microscopy
Glass

Keywords

  • Photothermal effects
  • Scanning microscopy
  • Surface plasmons

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

Cite this

Plasmonically Induced Potential in Metal–Semiconductor Composites. / Shahin, Shiva; Gangopadhyay, Palash; Norwood, Robert A.

In: Advanced Optical Materials, Vol. 4, No. 11, 01.11.2016, p. 1805-1810.

Research output: Contribution to journalArticle

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