Polarization analysis of optical systems

Research output: Contribution to journalConference article

12 Citations (Scopus)

Abstract

For the majority of optical systems it is typically assumed that the transmitted wavefront has uniform (or Gaussian) amplitude and constant polarization state. This is the default assumption of geometrical optics. This paper considers methods suitable for analyzing systems where this assumption is not valid. Such methods of polarization analysis include polarization ray tracing and polarization aberration theory. Definitions of the basic classes of polarization phenomena and a review of the Jones calculus are included to form a basis for the discussion.

Original languageEnglish (US)
Pages (from-to)10-31
Number of pages22
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume891
DOIs
StatePublished - Jun 29 1988
Externally publishedYes
EventPolarization Considerations for Optical Systems 1988 - Los Angeles, United States
Duration: Jan 11 1988Jan 17 1988

Fingerprint

Optical systems
Optical System
Polarization
polarization
Geometrical optics
Geometrical Optics
Ray Tracing
geometrical optics
calculus
Ray tracing
Wavefronts
Aberrations
Aberration
ray tracing
Wave Front
aberration
Calculus
Valid

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Polarization analysis of optical systems. / Chipman, Russell A.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 891, 29.06.1988, p. 10-31.

Research output: Contribution to journalConference article

@article{a461eb2deeb74899b75fced478204b9b,
title = "Polarization analysis of optical systems",
abstract = "For the majority of optical systems it is typically assumed that the transmitted wavefront has uniform (or Gaussian) amplitude and constant polarization state. This is the default assumption of geometrical optics. This paper considers methods suitable for analyzing systems where this assumption is not valid. Such methods of polarization analysis include polarization ray tracing and polarization aberration theory. Definitions of the basic classes of polarization phenomena and a review of the Jones calculus are included to form a basis for the discussion.",
author = "Chipman, {Russell A.}",
year = "1988",
month = "6",
day = "29",
doi = "10.1117/12.944290",
language = "English (US)",
volume = "891",
pages = "10--31",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

TY - JOUR

T1 - Polarization analysis of optical systems

AU - Chipman, Russell A.

PY - 1988/6/29

Y1 - 1988/6/29

N2 - For the majority of optical systems it is typically assumed that the transmitted wavefront has uniform (or Gaussian) amplitude and constant polarization state. This is the default assumption of geometrical optics. This paper considers methods suitable for analyzing systems where this assumption is not valid. Such methods of polarization analysis include polarization ray tracing and polarization aberration theory. Definitions of the basic classes of polarization phenomena and a review of the Jones calculus are included to form a basis for the discussion.

AB - For the majority of optical systems it is typically assumed that the transmitted wavefront has uniform (or Gaussian) amplitude and constant polarization state. This is the default assumption of geometrical optics. This paper considers methods suitable for analyzing systems where this assumption is not valid. Such methods of polarization analysis include polarization ray tracing and polarization aberration theory. Definitions of the basic classes of polarization phenomena and a review of the Jones calculus are included to form a basis for the discussion.

UR - http://www.scopus.com/inward/record.url?scp=0002944906&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0002944906&partnerID=8YFLogxK

U2 - 10.1117/12.944290

DO - 10.1117/12.944290

M3 - Conference article

AN - SCOPUS:0002944906

VL - 891

SP - 10

EP - 31

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -