Polarization characterization of an LCTV with a Mueller matrix imaging polarimeter

Joseph L. Pezzaniti, Russell A Chipman, Don A. Gregory

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The polarization properties of a TVT-6000 LCTV have been investigated. Mueller matrices of multiple ray paths through the TVT-6000 were measured for a single (typical) pixel, and through several pixels, using an imaging polarimeter. The TVT-6000 was characterized as a function of applied voltage and angle of incidence. From the Mueller matrices, the spatially dependent retardance, diattenuation, and depolarization are calculated and displayed as topographic maps. In another set of measurements, the LCTV is illuminated with a plane wave, and the spatial distribution of polarization in the Far Field Diffraction Pattern is measured in Mueller matrix form.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsDavid P. Casasent
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages235-247
Number of pages13
Volume1959
ISBN (Print)0819411957
StatePublished - 1993
Externally publishedYes
EventOptical Pattern Recognition IV - Orlando, FL, USA
Duration: Apr 13 1993Apr 14 1993

Other

OtherOptical Pattern Recognition IV
CityOrlando, FL, USA
Period4/13/934/14/93

Fingerprint

Polarimeters
polarimeters
Polarization
Imaging techniques
polarization
matrices
Pixels
pixels
Depolarization
depolarization
Diffraction patterns
Spatial distribution
far fields
rays
spatial distribution
plane waves
diffraction patterns
incidence
Electric potential
electric potential

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Pezzaniti, J. L., Chipman, R. A., & Gregory, D. A. (1993). Polarization characterization of an LCTV with a Mueller matrix imaging polarimeter. In D. P. Casasent (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1959, pp. 235-247). Publ by Society of Photo-Optical Instrumentation Engineers.

Polarization characterization of an LCTV with a Mueller matrix imaging polarimeter. / Pezzaniti, Joseph L.; Chipman, Russell A; Gregory, Don A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / David P. Casasent. Vol. 1959 Publ by Society of Photo-Optical Instrumentation Engineers, 1993. p. 235-247.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pezzaniti, JL, Chipman, RA & Gregory, DA 1993, Polarization characterization of an LCTV with a Mueller matrix imaging polarimeter. in DP Casasent (ed.), Proceedings of SPIE - The International Society for Optical Engineering. vol. 1959, Publ by Society of Photo-Optical Instrumentation Engineers, pp. 235-247, Optical Pattern Recognition IV, Orlando, FL, USA, 4/13/93.
Pezzaniti JL, Chipman RA, Gregory DA. Polarization characterization of an LCTV with a Mueller matrix imaging polarimeter. In Casasent DP, editor, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1959. Publ by Society of Photo-Optical Instrumentation Engineers. 1993. p. 235-247
Pezzaniti, Joseph L. ; Chipman, Russell A ; Gregory, Don A. / Polarization characterization of an LCTV with a Mueller matrix imaging polarimeter. Proceedings of SPIE - The International Society for Optical Engineering. editor / David P. Casasent. Vol. 1959 Publ by Society of Photo-Optical Instrumentation Engineers, 1993. pp. 235-247
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