Polarization characterization of self-imaging GaAs/AlGaAs waveguide beamsplitters using Mueller matrix imaging polarimetry

Matthew H. Smith, Elizabeth A. Sornsin, Tristan J. Tayag, Russell A. Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Mueller matrix imaging polarimetry represents a novel means of characterizing the polarization effects of optoelectronic devices. The Mueller matrix contains the complete polarization properties of a sample, and can therefore be used to calculate properties such as phase retardance, polarization dependant losses and polarization crosstalk. The complete polarization properties of a series of GaAs/AlGaAs self-imaging waveguide beamsplitters were measured with an imaging Mueller matrix polarimeter. Polarization properties were mapped across high resolution images of the devices' outcoupling faces, and the uniformity of the polarization properties was measured. Properties investigated include magnitude and orientation of linear retardance, polarization dependant losses, and crosstalk between TE and TM modes.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages330-337
Number of pages8
ISBN (Print)0819424056
StatePublished - Dec 1 1997
Externally publishedYes
EventPhysics and Simulation of Optoelectronic Devices V - San Jose, CA, USA
Duration: Feb 10 1997Feb 14 1997

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2994
ISSN (Print)0277-786X

Other

OtherPhysics and Simulation of Optoelectronic Devices V
CitySan Jose, CA, USA
Period2/10/972/14/97

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Smith, M. H., Sornsin, E. A., Tayag, T. J., & Chipman, R. A. (1997). Polarization characterization of self-imaging GaAs/AlGaAs waveguide beamsplitters using Mueller matrix imaging polarimetry. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 330-337). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2994). Society of Photo-Optical Instrumentation Engineers.