Polarization imaging light scattering facility

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Understanding the interaction of polarized light with materials is critical to applications such as remote sensing, laser radar, and quality control. The availability of angular and spatial information add additional dimensions to this understanding. A facility is constructed for Mueller Matrix Bidirectional Reflectance Distribution (MMBRDF) imaging. Polarized light at near infrared and visible wavelengths is scattered from samples ranging from bare metals to complex organic structures with various textures and orientations. The resulting scattered polarized light is measured with a Mueller matrix active imaging Polarimeter. The in-plane MMBRDF is measured for a sanded aluminum sample as a demonstration of the facility. The aluminum is found to be a weak depolarizer, with a somewhat higher depolarization index at specular angles. Retardance is dominated by its linear component and is close to 180° for the majority of angles. Diattenuation is weak, especially in the specular region, and increases in the region further away from specular angles.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6682
DOIs
StatePublished - 2007
EventPolarization Science and Remote Sensing III - San Diego, CA, United States
Duration: Aug 29 2007Aug 30 2007

Other

OtherPolarization Science and Remote Sensing III
CountryUnited States
CitySan Diego, CA
Period8/29/078/30/07

Fingerprint

Light polarization
Light scattering
polarized light
light scattering
Polarization
Imaging techniques
depolarization
polarization
Strategic materials
aluminum
Aluminum
bidirectional reflectance
Polarimeters
Depolarization
Optical radar
polarimeters
matrices
quality control
optical radar
Quality control

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Noble, H., Smith, G. A., Wai, S. L., Mcclain, S. C., & Chipman, R. A. (2007). Polarization imaging light scattering facility. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6682). [66820U] https://doi.org/10.1117/12.735013

Polarization imaging light scattering facility. / Noble, Hannah; Smith, Gregory A; Wai, Sze Lam; Mcclain, Stephen C; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6682 2007. 66820U.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Noble, H, Smith, GA, Wai, SL, Mcclain, SC & Chipman, RA 2007, Polarization imaging light scattering facility. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6682, 66820U, Polarization Science and Remote Sensing III, San Diego, CA, United States, 8/29/07. https://doi.org/10.1117/12.735013
Noble H, Smith GA, Wai SL, Mcclain SC, Chipman RA. Polarization imaging light scattering facility. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6682. 2007. 66820U https://doi.org/10.1117/12.735013
Noble, Hannah ; Smith, Gregory A ; Wai, Sze Lam ; Mcclain, Stephen C ; Chipman, Russell A. / Polarization imaging light scattering facility. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6682 2007.
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