Polarization scatter measurements with a Mueller matrix imaging polarimeter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A Mueller matrix imaging polarimeter is used to acquire polarization-sensitive images of seven different manmade samples in multiple scattering geometries. Successive Mueller matrix images of a sample with changing incidence and scatter angles are used to develop a Mueller matrix bidirectional reflectance distribution function for the sample in one plane of measurement. The Mueller matrix bidirectional reflectance distribution functions are compared, and patterns are noted. The most significant data for the scattering samples measured occurs along the diagonal of the respective Mueller matrices, indicating significant depolarization effects. Reduced depolarization data in the form of the average degree of polarization (of exiting light) for each sample is examined as a function of changing scattering geometry. Five of seven manmade samples exhibit an inverted Gaussian profile of depolarization with changing scattering geometry, the shape of which may prove useful for measuring sample properties (e.g. roughness) and for classifying or categorizing samples in a remote sensing scheme. Depolarization differences for each sample in response to changing incident polarization states are also examined, and a new metric, the degree of polarization surface, has been developed to visualize all such data simultaneously.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsP.T.C. Chen, J.C. Fleming, M.G. Dittman
Pages176-187
Number of pages12
Volume5526
DOIs
StatePublished - 2004
EventOptical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control - Denver, CO, United States
Duration: Aug 2 2004Aug 5 2004

Other

OtherOptical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control
CountryUnited States
CityDenver, CO
Period8/2/048/5/04

Fingerprint

Polarimeters
polarimeters
Depolarization
Polarization
Imaging techniques
polarization
matrices
depolarization
Scattering
Distribution functions
Geometry
bidirectional reflectance
Multiple scattering
scattering
geometry
Remote sensing
distribution functions
Surface roughness
classifying
remote sensing

Keywords

  • Depolarization
  • Polarimetry
  • Remote sensing
  • Scattering

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

DeBoo, B., & Chipman, R. A. (2004). Polarization scatter measurements with a Mueller matrix imaging polarimeter. In P. T. C. Chen, J. C. Fleming, & M. G. Dittman (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5526, pp. 176-187). [25] https://doi.org/10.1117/12.560202

Polarization scatter measurements with a Mueller matrix imaging polarimeter. / DeBoo, B.; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / P.T.C. Chen; J.C. Fleming; M.G. Dittman. Vol. 5526 2004. p. 176-187 25.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

DeBoo, B & Chipman, RA 2004, Polarization scatter measurements with a Mueller matrix imaging polarimeter. in PTC Chen, JC Fleming & MG Dittman (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5526, 25, pp. 176-187, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control, Denver, CO, United States, 8/2/04. https://doi.org/10.1117/12.560202
DeBoo B, Chipman RA. Polarization scatter measurements with a Mueller matrix imaging polarimeter. In Chen PTC, Fleming JC, Dittman MG, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5526. 2004. p. 176-187. 25 https://doi.org/10.1117/12.560202
DeBoo, B. ; Chipman, Russell A. / Polarization scatter measurements with a Mueller matrix imaging polarimeter. Proceedings of SPIE - The International Society for Optical Engineering. editor / P.T.C. Chen ; J.C. Fleming ; M.G. Dittman. Vol. 5526 2004. pp. 176-187
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