Polarization scattering from a Spectralon calibration sample

Hannah Noble, Wai Sze Tiffany Lam, Greg Smith, Stephen McClain, Russell A. Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

The in-plane Mueller matrix bidirectional reflectance distribution function (MMBRDF) is measured for a Spectralon calibration target with a reflectance of 99%. Measurements are acquired using a Mueller matrix active imaging, goniometric polarimeter operated in the near infrared at 1550nm. The Spectralon is measured for both incident and scattering angles from -80 degrees to 80 degrees to within 20 degrees of retro-reflection. A range of polarization states is generated and scattered polarization states are analyzed by means of a dual rotating retarder Mueller matrix polarimeter. Complete Mueller matrix data is measured with a high-resolution camera in image form. Polarization scatter data is presented in Mueller matrix angular arrays. As expected the Spectralon is a strong depolarizer and weak s-plane oriented diattenuator. It was also a weak retarder. Diattenuation and retardance are strongest at horizontal and vertical polarizations, and weakest for circular polarization states.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing III
DOIs
StatePublished - Dec 1 2007
EventPolarization Science and Remote Sensing III - San Diego, CA, United States
Duration: Aug 29 2007Aug 30 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6682
ISSN (Print)0277-786X

Other

OtherPolarization Science and Remote Sensing III
CountryUnited States
CitySan Diego, CA
Period8/29/078/30/07

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Keywords

  • BRDF
  • Mueller matrix
  • Polarimetry
  • Spectralon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Noble, H., Lam, W. S. T., Smith, G., McClain, S., & Chipman, R. A. (2007). Polarization scattering from a Spectralon calibration sample. In Polarization Science and Remote Sensing III [668219] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6682). https://doi.org/10.1117/12.747483