Polarization scattering from a Spectralon calibration sample

Hannah Noble, Wai Sze Tiffany Lam, Gregory A Smith, Stephen C Mcclain, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

The in-plane Mueller matrix bidirectional reflectance distribution function (MMBRDF) is measured for a Spectralon calibration target with a reflectance of 99%. Measurements are acquired using a Mueller matrix active imaging, goniometric polarimeter operated in the near infrared at 1550nm. The Spectralon is measured for both incident and scattering angles from -80 degrees to 80 degrees to within 20 degrees of retro-reflection. A range of polarization states is generated and scattered polarization states are analyzed by means of a dual rotating retarder Mueller matrix polarimeter. Complete Mueller matrix data is measured with a high-resolution camera in image form. Polarization scatter data is presented in Mueller matrix angular arrays. As expected the Spectralon is a strong depolarizer and weak s-plane oriented diattenuator. It was also a weak retarder. Diattenuation and retardance are strongest at horizontal and vertical polarizations, and weakest for circular polarization states.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6682
DOIs
StatePublished - 2007
EventPolarization Science and Remote Sensing III - San Diego, CA, United States
Duration: Aug 29 2007Aug 30 2007

Other

OtherPolarization Science and Remote Sensing III
CountryUnited States
CitySan Diego, CA
Period8/29/078/30/07

Fingerprint

Calibration
Scattering
Polarization
polarization
matrices
retarders
scattering
Polarimeters
polarimeters
bidirectional reflectance
Circular polarization
circular polarization
depolarization
Distribution functions
distribution functions
Cameras
cameras
Infrared radiation
reflectance
Imaging techniques

Keywords

  • BRDF
  • Mueller matrix
  • Polarimetry
  • Spectralon

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Noble, H., Lam, W. S. T., Smith, G. A., Mcclain, S. C., & Chipman, R. A. (2007). Polarization scattering from a Spectralon calibration sample. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6682). [668219] https://doi.org/10.1117/12.747483

Polarization scattering from a Spectralon calibration sample. / Noble, Hannah; Lam, Wai Sze Tiffany; Smith, Gregory A; Mcclain, Stephen C; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6682 2007. 668219.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Noble, H, Lam, WST, Smith, GA, Mcclain, SC & Chipman, RA 2007, Polarization scattering from a Spectralon calibration sample. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6682, 668219, Polarization Science and Remote Sensing III, San Diego, CA, United States, 8/29/07. https://doi.org/10.1117/12.747483
Noble H, Lam WST, Smith GA, Mcclain SC, Chipman RA. Polarization scattering from a Spectralon calibration sample. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6682. 2007. 668219 https://doi.org/10.1117/12.747483
Noble, Hannah ; Lam, Wai Sze Tiffany ; Smith, Gregory A ; Mcclain, Stephen C ; Chipman, Russell A. / Polarization scattering from a Spectralon calibration sample. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6682 2007.
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