Polarization: Systems, Measurement, Analysis, and Remote Sensing

David B. Chenault, Dennis H. Goldstein, Michael W. Kudenov, Meridith Kathryn Kupinski, J. Larry Pezzaniti, Joseph A. Shaw, Frans Snik, J Scott Tyo, Christine L. Bradley

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Article number082401
JournalOptical Engineering
Volume58
Issue number8
DOIs
StatePublished - Aug 1 2019

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

Cite this

Chenault, D. B., Goldstein, D. H., Kudenov, M. W., Kupinski, M. K., Larry Pezzaniti, J., Shaw, J. A., Snik, F., Tyo, J. S., & Bradley, C. L. (2019). Polarization: Systems, Measurement, Analysis, and Remote Sensing. Optical Engineering, 58(8), [082401]. https://doi.org/10.1117/1.OE.58.8.082401