Polyceram planar waveguides and optical properties of polyceram films

S. Motakef, J. M. Boulton, Gimtong T. Teowee, Donald R. Uhlmann, Brian J. Zelinski, Raymond Zanoni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Abstract

Low loss sol-gel derived polyceram optical waveguides have been prepared for the first time. Polyceram films were obtained by reacting (N-triethoxysilyl propyl) o-polyethylene oxide urethane with silicon and titanium alkoxides. The optical properties of the films were investigated using ellipsometry, UV-VIS transmission spectroscopy and waveguide loss measurements. Refractive index and attenuation loss measurements were carried out as a function of organic/inorganic content, different processing conditions and aging of solutions. Refractive indices as high as 1.685 and attenuation losses as low as 1.4 dB/cm were obtained. In addition, surface morphology, mechanical properties and thermal stability of the polyceram films were studied.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages432-445
Number of pages14
ISBN (Print)0819409316, 9780819409317
DOIs
StatePublished - 1992
EventSol-Gel Optics II - San Diego, CA, USA
Duration: Jul 20 1992Jul 22 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1758
ISSN (Print)0277-786X

Other

OtherSol-Gel Optics II
CitySan Diego, CA, USA
Period7/20/927/22/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Motakef, S., Boulton, J. M., Teowee, G. T., Uhlmann, D. R., Zelinski, B. J., & Zanoni, R. (1992). Polyceram planar waveguides and optical properties of polyceram films. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 432-445). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1758). Publ by Int Soc for Optical Engineering. https://doi.org/10.1117/12.132035