Precision measurement meets ultrafast control

J. Ye, S. Blatt, M. M. Boyd, S. M. Foreman, T. Ido, Ronald J Jones, A. D. Ludlow, A. Marian, K. Moll, M. Notcutt, M. Stowe, M. Thorpe, T. Zelevinsky

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Optical spectroscopy and frequency metrology at the highest level of precision and resolution are being greatly facilitated by the use of ultracold atoms and phase stabilized light in the form of both cw and ultrashort pulses. It is now possible to pursue simultaneously coherent control of quantum dynamics in the time domain and high precision measurements of global atomic structure in the frequency domain. These coherent light-based precision measurement capabilities may be extended to the XUV spectral region, where new possibilities and challenges lie for precise tests of fundamental physical principles.

Original languageEnglish (US)
Title of host publicationLaser Spectroscopy - Proceedings of the 17th International Conference, ICOLS 2005
PublisherWorld Scientific Publishing Co. Pte Ltd
Pages14-24
Number of pages11
ISBN (Print)9789812566591
StatePublished - 2005
Externally publishedYes
Event17th International Conference on Laser Spectroscopy, ICOLS 2005 - Aviemore, United Kingdom
Duration: Jun 19 2005Jun 24 2005

Other

Other17th International Conference on Laser Spectroscopy, ICOLS 2005
CountryUnited Kingdom
CityAviemore
Period6/19/056/24/05

Fingerprint

coherent light
atomic structure
metrology
pulses
spectroscopy
atoms

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Cite this

Ye, J., Blatt, S., Boyd, M. M., Foreman, S. M., Ido, T., Jones, R. J., ... Zelevinsky, T. (2005). Precision measurement meets ultrafast control. In Laser Spectroscopy - Proceedings of the 17th International Conference, ICOLS 2005 (pp. 14-24). World Scientific Publishing Co. Pte Ltd.

Precision measurement meets ultrafast control. / Ye, J.; Blatt, S.; Boyd, M. M.; Foreman, S. M.; Ido, T.; Jones, Ronald J; Ludlow, A. D.; Marian, A.; Moll, K.; Notcutt, M.; Stowe, M.; Thorpe, M.; Zelevinsky, T.

Laser Spectroscopy - Proceedings of the 17th International Conference, ICOLS 2005. World Scientific Publishing Co. Pte Ltd, 2005. p. 14-24.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ye, J, Blatt, S, Boyd, MM, Foreman, SM, Ido, T, Jones, RJ, Ludlow, AD, Marian, A, Moll, K, Notcutt, M, Stowe, M, Thorpe, M & Zelevinsky, T 2005, Precision measurement meets ultrafast control. in Laser Spectroscopy - Proceedings of the 17th International Conference, ICOLS 2005. World Scientific Publishing Co. Pte Ltd, pp. 14-24, 17th International Conference on Laser Spectroscopy, ICOLS 2005, Aviemore, United Kingdom, 6/19/05.
Ye J, Blatt S, Boyd MM, Foreman SM, Ido T, Jones RJ et al. Precision measurement meets ultrafast control. In Laser Spectroscopy - Proceedings of the 17th International Conference, ICOLS 2005. World Scientific Publishing Co. Pte Ltd. 2005. p. 14-24
Ye, J. ; Blatt, S. ; Boyd, M. M. ; Foreman, S. M. ; Ido, T. ; Jones, Ronald J ; Ludlow, A. D. ; Marian, A. ; Moll, K. ; Notcutt, M. ; Stowe, M. ; Thorpe, M. ; Zelevinsky, T. / Precision measurement meets ultrafast control. Laser Spectroscopy - Proceedings of the 17th International Conference, ICOLS 2005. World Scientific Publishing Co. Pte Ltd, 2005. pp. 14-24
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