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Precision measurement meets ultrafast control
J. Ye, S. Blatt, M. M. Boyd, S. M. Foreman, T. Ido, R. J. Jones, A. D. Ludlow, A. Marian, K. Moll, M. Notcutt, M. Stowe, M. Thorpe, T. Zelevinsky
Research output: Chapter in Book/Report/Conference proceeding › Chapter