Precision polarimetry of polarization components

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Polarization elements are inadequately characterized for many applications. For retarders, usually only the retardance is specified. For polarizers, usually only the two principal transmittances or the extinction ratio are given. For polarization elements used in critical applications, this level of characterization is woefully inadequate. Defects of polarization elements are described, and the Mueller calculus suggested as the most appropriate measure of performance. Examples of the characterization of polarization elements as a function of angle of incidence, and as a function of wavelength are provided.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages49-60
Number of pages12
ISBN (Print)0819409197
StatePublished - Dec 1 1992
Externally publishedYes
EventPolarization Analysis and Measurement - San Diego, CA, USA
Duration: Jul 19 1992Jul 21 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1746
ISSN (Print)0277-786X

Other

OtherPolarization Analysis and Measurement
CitySan Diego, CA, USA
Period7/19/927/21/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Chipman, R. A. (1992). Precision polarimetry of polarization components. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 49-60). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1746). Publ by Int Soc for Optical Engineering.