Predicting interconnect uncertainty with a new robust model order reduction method

Janet Wang, Omar Hafiz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

As we scale toward nanometer technologies, the increase in interconnect parameter variations will bring significant performance variability. New design methodologies will emerge to facilitate construction of reliable systems from unreliable nanometer scale components. Such methodologies require new performance models which accurately capture the manufacturing realities. In this paper, we present a Linear Fractional Transform (LFT) based model for interconnect Parametric Uncertainty. This new model formulates the interconnect parameter uncertainty as a repeated scalar uncertainty structure. With the help of generalized Balanced Truncation Realization (BTR) based on Linear Matrix Inequalities (LMI's), the new model reduces the order of the original interconnect network while preserves the stability. This paper also shows that the LFT based model even guarantees passivity if the BTR reduction is based on solutions to a pair of Linear Matrix Inequalities (LMI's) which generalizes Lur'e equations.

Original languageEnglish (US)
Title of host publicationProceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004
PublisherIEEE Computer Society
Pages363-368
Number of pages6
ISBN (Print)0769520936, 9780769520933
DOIs
StatePublished - Jan 1 2004
EventProceedings - 5th International Symposium on Quality Electronic Design, ISQED 2004 - San Jose, CA, United States
Duration: Mar 22 2004Mar 24 2004

Publication series

NameProceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004

Conference

ConferenceProceedings - 5th International Symposium on Quality Electronic Design, ISQED 2004
CountryUnited States
CitySan Jose, CA
Period3/22/043/24/04

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Wang, J., & Hafiz, O. (2004). Predicting interconnect uncertainty with a new robust model order reduction method. In Proceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004 (pp. 363-368). (Proceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004). IEEE Computer Society. https://doi.org/10.1109/ISQED.2004.1283701