Probing of basal planes of MoS2 by scanning tunneling microscopy

Dror Sarid, Tammy D. Henson, Neal R Armstrong, L. Stephen Bell

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

Atomically resolved images of MoS2 have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the density of states of the valence and conduction bands can be inferred.

Original languageEnglish (US)
Pages (from-to)2252-2254
Number of pages3
JournalApplied Physics Letters
Volume52
Issue number26
DOIs
StatePublished - 1988

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scanning tunneling microscopy
conduction bands
valence
electric potential
symmetry
curves
crystals

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Probing of basal planes of MoS2 by scanning tunneling microscopy. / Sarid, Dror; Henson, Tammy D.; Armstrong, Neal R; Bell, L. Stephen.

In: Applied Physics Letters, Vol. 52, No. 26, 1988, p. 2252-2254.

Research output: Contribution to journalArticle

Sarid, Dror ; Henson, Tammy D. ; Armstrong, Neal R ; Bell, L. Stephen. / Probing of basal planes of MoS2 by scanning tunneling microscopy. In: Applied Physics Letters. 1988 ; Vol. 52, No. 26. pp. 2252-2254.
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