Properties of the polarization ray tracing matrix

Garam Yun, Karlton Crabtree, Russell A. Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Abstract

The properties of a 3 × 3 polarization ray tracing matrix formalism are presented and the role of this method in optical design. Properties of diattenuator matrices are derived and methods for analyzing diattenuation of arbitrary homogeneous and inhomogeneous matrices are presented. The 3x3 matrix formalism is used to analyze polarization properties of an example corner cube.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing III
DOIs
StatePublished - Dec 1 2007
EventPolarization Science and Remote Sensing III - San Diego, CA, United States
Duration: Aug 29 2007Aug 30 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6682
ISSN (Print)0277-786X

Other

OtherPolarization Science and Remote Sensing III
CountryUnited States
CitySan Diego, CA
Period8/29/078/30/07

Keywords

  • Diattenuation
  • Polarization ray tracing
  • Ray tracing
  • Singular value decomposition

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Yun, G., Crabtree, K., & Chipman, R. A. (2007). Properties of the polarization ray tracing matrix. In Polarization Science and Remote Sensing III [66820Z] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6682). https://doi.org/10.1117/12.734315