Quality assurance of global vegetation index compositing algorithm using AVHRR data

Willem van Leeuwen, Trevor W. Laing, Alfredo R. Huete

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this study the quality control aspects of the vegetation index produced by the MODIS (MODerate resolution Imaging Spectroradiometer) algorithm were evaluated and compared with the results of the currently used maximum value composite (MVC), which chooses the highest NDVI (normalized difference vegetation index) over a certain time interval. The composite scenarios were evaluated with respect to: 1) quality flags related to data integrity, cloud cover and composite method, 2) temporal evolution of the VI for different continents and vegetation cover types, and 3) accuracy of the standardization of reflectance values to standard view angles (nadir). On a continental scale the composited NDVI results from the MODIS algorithm were 1 to 24% lower than the off-nadir NDVI results based on the MVC criteria. A simple BRDF (Bidirectional Reflectance Distribution Function) model was adequate to produce nadir equivalent reflectance values from which the NDVI could be computed. The temporal evolution of the NDVI derived with the MODIS algorithm was similar to or smoother than the NDVI derived from the MVC algorithm. The composite method applied in the MODIS algorithm, was dependent on the global position and season, e.g. the BRDF interpolation was most frequently applied in arid and semi-arid regions and during the dry season over tropical rain forests. Examples of a global NDVI and quality flags were displayed using a pseudo color bit mapping scheme.

Original languageEnglish (US)
Title of host publicationInternational Geoscience and Remote Sensing Symposium (IGARSS)
Editors Anon
PublisherIEEE
Pages341-343
Number of pages3
Volume1
StatePublished - 1997
EventProceedings of the 1997 IEEE International Geoscience and Remote Sensing Symposium, IGARSS'97. Part 1 (of 4) - Singapore, Singapore
Duration: Aug 3 1997Aug 8 1997

Other

OtherProceedings of the 1997 IEEE International Geoscience and Remote Sensing Symposium, IGARSS'97. Part 1 (of 4)
CitySingapore, Singapore
Period8/3/978/8/97

Fingerprint

Advanced very high resolution radiometers (AVHRR)
vegetation index
Quality assurance
AVHRR
NDVI
MODIS
nadir
Composite materials
bidirectional reflectance
temporal evolution
Imaging techniques
reflectance
Distribution functions
quality assurance
Arid regions
semiarid region
standardization
cloud cover
quality control
vegetation cover

ASJC Scopus subject areas

  • Software
  • Geology

Cite this

van Leeuwen, W., Laing, T. W., & Huete, A. R. (1997). Quality assurance of global vegetation index compositing algorithm using AVHRR data. In Anon (Ed.), International Geoscience and Remote Sensing Symposium (IGARSS) (Vol. 1, pp. 341-343). IEEE.

Quality assurance of global vegetation index compositing algorithm using AVHRR data. / van Leeuwen, Willem; Laing, Trevor W.; Huete, Alfredo R.

International Geoscience and Remote Sensing Symposium (IGARSS). ed. / Anon. Vol. 1 IEEE, 1997. p. 341-343.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

van Leeuwen, W, Laing, TW & Huete, AR 1997, Quality assurance of global vegetation index compositing algorithm using AVHRR data. in Anon (ed.), International Geoscience and Remote Sensing Symposium (IGARSS). vol. 1, IEEE, pp. 341-343, Proceedings of the 1997 IEEE International Geoscience and Remote Sensing Symposium, IGARSS'97. Part 1 (of 4), Singapore, Singapore, 8/3/97.
van Leeuwen W, Laing TW, Huete AR. Quality assurance of global vegetation index compositing algorithm using AVHRR data. In Anon, editor, International Geoscience and Remote Sensing Symposium (IGARSS). Vol. 1. IEEE. 1997. p. 341-343
van Leeuwen, Willem ; Laing, Trevor W. ; Huete, Alfredo R. / Quality assurance of global vegetation index compositing algorithm using AVHRR data. International Geoscience and Remote Sensing Symposium (IGARSS). editor / Anon. Vol. 1 IEEE, 1997. pp. 341-343
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