Quantitation of Auger and X-ray photoelectron spectroscopies

Kenneth W. Nebesny, Brian L. Maschhoff, Neal R Armstrong

Research output: Contribution to journalArticle

40 Citations (Scopus)

Abstract

Complex sample matrix and instrumental parameters make quantitation of surface electron spectroscopies a real challenge. Kenneth W. Nebesny, Brian L. Maschhoff, and Neal R. Armstrong of the University of Arizona describe approaches that make it possible to obtain reliable compositional information.

Original languageEnglish (US)
JournalAnalytical Chemistry
Volume61
Issue number7
StatePublished - 1989

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Electron spectroscopy
X ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

Quantitation of Auger and X-ray photoelectron spectroscopies. / Nebesny, Kenneth W.; Maschhoff, Brian L.; Armstrong, Neal R.

In: Analytical Chemistry, Vol. 61, No. 7, 1989.

Research output: Contribution to journalArticle

Nebesny, Kenneth W. ; Maschhoff, Brian L. ; Armstrong, Neal R. / Quantitation of Auger and X-ray photoelectron spectroscopies. In: Analytical Chemistry. 1989 ; Vol. 61, No. 7.
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