Quantitative analysis of qualitative images

David Hockney, Charles M Falco

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Abstract

We show optical evidence that demonstrates artists as early as Jan van Eyck and Robert Campin (c1425) used optical projections as aids for producing their paintings. We also have found optical evidence within works by later artists, including Bermejo (c1475), Lotto (c1525), Caravaggio (c1600), de la Tour (c1650), Chardin (c1750) and Ingres (c1825), demonstrating a continuum in the use of optical projections by artists, along with an evolution in the sophistication of that use. However, even for paintings where we have been able to extract unambiguous, quantitative evidence of the direct use of optical projections for producing certain of the features, this does not mean that paintings are effectively photographs. Because the hand and mind of the artist are intimately involved in the creation process, understanding these complex images requires more than can be obtained from only applying the equations of geometrical optics.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsB.E. Rogowitz, T.N. Pappas, S.J. Daly
Pages326-336
Number of pages11
Volume5666
DOIs
Publication statusPublished - 2005
EventProceedings of SPIE-IS and T Electronic Imaging - Human Vision and Electronic Imaging X - San Jose, CA, United States
Duration: Jan 17 2005Jan 20 2005

Other

OtherProceedings of SPIE-IS and T Electronic Imaging - Human Vision and Electronic Imaging X
CountryUnited States
CitySan Jose, CA
Period1/17/051/20/05

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Keywords

  • Art
  • Holbein
  • Human vision
  • Image analysis
  • Paintings
  • Renaissance
  • Van Eyck

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Hockney, D., & Falco, C. M. (2005). Quantitative analysis of qualitative images. In B. E. Rogowitz, T. N. Pappas, & S. J. Daly (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5666, pp. 326-336). [36] https://doi.org/10.1117/12.601937