Quantitative prediction of semiconductor laser characteristics based on low intensity photoluminescence measurements

Jorg Hader, A. R. Zakharian, Jerome V Moloney, T. R. Nelson, W. J. Siskaninetz, J. E. Ehret, K. Hantke, M. Hofmann, Stephan W Koch

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

A general scheme for the determination of vital operating characteristics of semiconductor lasers from low intensity photo-luminescence spectra is outlined and demonstrated.

Original languageEnglish (US)
Pages (from-to)762-764
Number of pages3
JournalIEEE Photonics Technology Letters
Volume14
Issue number6
DOIs
StatePublished - Jun 2002

Fingerprint

Semiconductor lasers
Photoluminescence
semiconductor lasers
photoluminescence
predictions

Keywords

  • Gain
  • Photo luminescence
  • Semiconductor lasers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Physics and Astronomy (miscellaneous)

Cite this

Quantitative prediction of semiconductor laser characteristics based on low intensity photoluminescence measurements. / Hader, Jorg; Zakharian, A. R.; Moloney, Jerome V; Nelson, T. R.; Siskaninetz, W. J.; Ehret, J. E.; Hantke, K.; Hofmann, M.; Koch, Stephan W.

In: IEEE Photonics Technology Letters, Vol. 14, No. 6, 06.2002, p. 762-764.

Research output: Contribution to journalArticle

Hader, Jorg ; Zakharian, A. R. ; Moloney, Jerome V ; Nelson, T. R. ; Siskaninetz, W. J. ; Ehret, J. E. ; Hantke, K. ; Hofmann, M. ; Koch, Stephan W. / Quantitative prediction of semiconductor laser characteristics based on low intensity photoluminescence measurements. In: IEEE Photonics Technology Letters. 2002 ; Vol. 14, No. 6. pp. 762-764.
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