Quantitative prediction of semiconductor laser characteristics based on low intensity photoluminescence measurements

Jorg Hader, A. R. Zakharian, Jerome V Moloney, T. R. Nelson, W. J. Siskaninetz, J. E. Ehret, K. Hantke, M. Hofmann, Stephan W Koch

Research output: Contribution to journal › Article

23 Citations (Scopus)

Abstract

A general scheme for the determination of vital operating characteristics of semiconductor lasers from low intensity photo-luminescence spectra is outlined and demonstrated.

Original languageEnglish (US)
Pages (from-to)762-764
Number of pages3
JournalIEEE Photonics Technology Letters
Volume14
Issue number6
DOIs
StatePublished - Jun 2002

Fingerprint

Semiconductor lasers
Photoluminescence
semiconductor lasers
photoluminescence
predictions

Keywords

  • Gain
  • Photo luminescence
  • Semiconductor lasers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Physics and Astronomy (miscellaneous)

Cite this

Quantitative prediction of semiconductor laser characteristics based on low intensity photoluminescence measurements. / Hader, Jorg; Zakharian, A. R.; Moloney, Jerome V; Nelson, T. R.; Siskaninetz, W. J.; Ehret, J. E.; Hantke, K.; Hofmann, M.; Koch, Stephan W.

In: IEEE Photonics Technology Letters, Vol. 14, No. 6, 06.2002, p. 762-764.

Research output: Contribution to journal › Article

Hader, J, Zakharian, AR, Moloney, JV, Nelson, TR, Siskaninetz, WJ, Ehret, JE, Hantke, K, Hofmann, M & Koch, SW 2002, 'Quantitative prediction of semiconductor laser characteristics based on low intensity photoluminescence measurements', IEEE Photonics Technology Letters, vol. 14, no. 6, pp. 762-764. https://doi.org/10.1109/LPT.2002.1003085
Hader J, Zakharian AR, Moloney JV, Nelson TR, Siskaninetz WJ, Ehret JE et al. Quantitative prediction of semiconductor laser characteristics based on low intensity photoluminescence measurements. IEEE Photonics Technology Letters. 2002 Jun;14(6):762-764. https://doi.org/10.1109/LPT.2002.1003085
Hader, Jorg ; Zakharian, A. R. ; Moloney, Jerome V ; Nelson, T. R. ; Siskaninetz, W. J. ; Ehret, J. E. ; Hantke, K. ; Hofmann, M. ; Koch, Stephan W. / Quantitative prediction of semiconductor laser characteristics based on low intensity photoluminescence measurements. In: IEEE Photonics Technology Letters. 2002 ; Vol. 14, No. 6. pp. 762-764.
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