Quantum efficiency characterization of scientific CCDs

Michael P Lesser, Bradley McCarthy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

Characterization of CCDs is extremely important when developing scientific detectors. If CCD foundries are used to produce the devices, the foundries require feedback to maintain a quality process. In this case, the users require fairly automated testing to evaluate the large number of devices obtained from even a single lot run. We have developed a CCD characterization facility which is used to evaluate these foundry devices as well as commercial scientific images. Our test capabilities include automated QE measurements, X-ray CTE and gain calibration, optical illumination from 200 nm - 1200 nm, and dark current and read noise characterization. We can also make interferometric flatness measurements of the devices. A cryogenic probe station for wafer testing is being developed to extend some of these tests to the wafer level. We discuss in this paper our facilities and techniques to measure the quantum efficiency (QE) of scientific CCDs. QE (along with read noise) is perhaps the most important parameter for many classes of astronomical observations when working at very low light levels. It is also the most useful parameter for evaluating the quality of backside processing when developing back illuminated CCDs.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsConstantine N. Anagnostopoulos, Morley M. Blouke, Michael P. Lesser
Pages278-286
Number of pages9
Volume2654
StatePublished - 1996
EventSolid State Sensor Arrays and CCD Cameras - San Jose, CA, USA
Duration: Jan 31 1996Feb 2 1996

Other

OtherSolid State Sensor Arrays and CCD Cameras
CitySan Jose, CA, USA
Period1/31/962/2/96

Fingerprint

Quantum efficiency
Charge coupled devices
quantum efficiency
charge coupled devices
foundries
Foundries
wafers
Dark currents
Testing
flatness
dark current
Cryogenics
cryogenics
stations
Lighting
illumination
Calibration
Detectors
Feedback
X rays

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Lesser, M. P., & McCarthy, B. (1996). Quantum efficiency characterization of scientific CCDs. In C. N. Anagnostopoulos, M. M. Blouke, & M. P. Lesser (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2654, pp. 278-286)

Quantum efficiency characterization of scientific CCDs. / Lesser, Michael P; McCarthy, Bradley.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Constantine N. Anagnostopoulos; Morley M. Blouke; Michael P. Lesser. Vol. 2654 1996. p. 278-286.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lesser, MP & McCarthy, B 1996, Quantum efficiency characterization of scientific CCDs. in CN Anagnostopoulos, MM Blouke & MP Lesser (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 2654, pp. 278-286, Solid State Sensor Arrays and CCD Cameras, San Jose, CA, USA, 1/31/96.
Lesser MP, McCarthy B. Quantum efficiency characterization of scientific CCDs. In Anagnostopoulos CN, Blouke MM, Lesser MP, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 2654. 1996. p. 278-286
Lesser, Michael P ; McCarthy, Bradley. / Quantum efficiency characterization of scientific CCDs. Proceedings of SPIE - The International Society for Optical Engineering. editor / Constantine N. Anagnostopoulos ; Morley M. Blouke ; Michael P. Lesser. Vol. 2654 1996. pp. 278-286
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