Radiometrically-calibrated scene-based nonuniformity correction for infrared array sensors

Bradley M. Ratliff, Majeed M. Hayat, J. Scott Tyo

Research output: Contribution to journalConference article

11 Scopus citations

Abstract

This paper describes how a limited form of black-body-based calibration can be integrated into a recently developed algebraic scene-based algorithm for nonuniformity correction (NUC) in focal-plane arrays. The result of this integration is a scene-based NUC algorithm that is radiometrically accurate. By calibrating only those detectors that are on the array perimeter and relying on the scene-based algorithm to calibrate the interior detectors, using the perimeter detectors as a reference, radiometric accuracy can be achieved without disturbing the functionality of interior array elements. What makes this possible is the fact that the scene-based NUC algorithm used here is algebraic in nature and does not rely on any statistical assumptions on the scene irradiance in the image sequence. The algorithm utilizes knowledge of inter-frame motion to "lock" the biases of the interior array elements to those on the boundary. Notably, this can be achieved regardless of the spatial diversity in the scene and with, typically, a minimal number of frames in an image sequence. The performance of the technique is demonstrated using real infrared data.

Original languageEnglish (US)
Pages (from-to)359-367
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4820
Issue number1
DOIs
StatePublished - Dec 1 2002
EventInfrared Technology and Applications XXVIII - Seattle, WA, United States
Duration: Jul 7 2002Jul 11 2002

Keywords

  • Calibration
  • Fixed-pattern noise
  • Focal-plane array
  • Infrared sensors
  • Nonuniformity correction
  • Radiometric accuracy
  • Scene-based NUC

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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