Random projections based feature-specific structured imaging

Pawan K. Baheti, Mark A. Neifeld

Research output: Contribution to journalArticle

8 Scopus citations

Abstract

We present a feature-specific imaging system based on the use of structured illumination. The measurements are defined as inner products between the illumination patterns and the object reflectance function, measured on a single photodetector. The illumination patterns are defined using random binary patterns and thus do not employ prior knowledge about the object. Object estimates are generated using L1-norm minimization and gradient-projection sparse reconstruction algorithms. The experimental reconstructions show the feasibility of the proposed approach by using 42% fewer measurements than the object dimensionality.

Original languageEnglish (US)
Pages (from-to)1764-1776
Number of pages13
JournalOptics Express
Volume16
Issue number3
DOIs
StatePublished - Feb 4 2008

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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