Random projections based feature-specific structured imaging

Pawan K. Baheti, Mark A Neifeld

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

We present a feature-specific imaging system based on the use of structured illumination. The measurements are defined as inner products between the illumination patterns and the object reflectance function, measured on a single photodetector. The illumination patterns are defined using random binary patterns and thus do not employ prior knowledge about the object. Object estimates are generated using L1-norm minimization and gradient-projection sparse reconstruction algorithms. The experimental reconstructions show the feasibility of the proposed approach by using 42% fewer measurements than the object dimensionality.

Original languageEnglish (US)
Pages (from-to)1764-1776
Number of pages13
JournalOptics Express
Volume16
Issue number3
DOIs
StatePublished - Feb 4 2008

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projection
illumination
norms
photometers
reflectance
gradients
optimization
estimates
products

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Random projections based feature-specific structured imaging. / Baheti, Pawan K.; Neifeld, Mark A.

In: Optics Express, Vol. 16, No. 3, 04.02.2008, p. 1764-1776.

Research output: Contribution to journalArticle

Baheti, Pawan K. ; Neifeld, Mark A. / Random projections based feature-specific structured imaging. In: Optics Express. 2008 ; Vol. 16, No. 3. pp. 1764-1776.
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