Ray and van Cittert-Zernike characterization of spatial coherence

José M. Sasián, Scott A. Lerner, Tony Y. Lin, Lenny Laughlin

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

We discuss a ray and a van Cittert-Zernike characterization of spatial coherence in condensers for projection systems. We present a rule of thumb with which to estimate the modulus of the coherence function at a given point of the illuminated object and a ray-tracing methodology with which to determine this modulus. For uniform illumination of the pupil we relate the modulus of the coherence function and the pupil-filling factor. We suggest that the rms of the angular ray spread at a given object point is an appropriate metric with which to characterize local coherence properties.

Original languageEnglish (US)
Pages (from-to)1037-1043
Number of pages7
JournalApplied optics
Volume40
Issue number7
DOIs
StatePublished - Mar 1 2001

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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