Ray tracing in biaxial materials

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Algorithms for polarization ray tracing biaxial materials and calculating the directions of ray propagation and energy flow, the refractive indices, and the coupling coefficients for all four resultant reflected and transmitted rays are presented.

Original languageEnglish (US)
Title of host publicationInternational Optical Design Conference, IODC 2010
StatePublished - Dec 1 2010
EventInternational Optical Design Conference, IODC 2010 - Jackson Hole, WY, United States
Duration: Jun 13 2010Jun 17 2010

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherInternational Optical Design Conference, IODC 2010
CountryUnited States
CityJackson Hole, WY
Period6/13/106/17/10

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Lam, W. S. T., McClain, S., Smith, G., & Chipman, R. (2010). Ray tracing in biaxial materials. In International Optical Design Conference, IODC 2010 (Optics InfoBase Conference Papers).