Ray tracing in biaxial materials

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Algorithms for polarization ray tracing biaxial materials and calculating the directions of ray propagation and energy flow, the refractive indices, and the coupling coefficients for all four resultant reflected and transmitted rays are presented. Examples of polarization state maps, retardance maps and diattenuation maps are generated as a function of angle of incidence for comparing plane parallel plate systems with uniaxial and biaxial materials.

Original languageEnglish (US)
Title of host publicationInternational Optical Design Conference 2010
DOIs
StatePublished - Nov 8 2010
EventInternational Optical Design Conference 2010 - Jackson Hole, WY, United States
Duration: Jun 13 2010Jun 17 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7652
ISSN (Print)0277-786X

Other

OtherInternational Optical Design Conference 2010
CountryUnited States
CityJackson Hole, WY
Period6/13/106/17/10

Keywords

  • Polarization ray tracing
  • biaxial materials
  • birefringent material

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Lam, W. S. T., McClain, S., Smith, G. A., & Chipman, R. (2010). Ray tracing in biaxial materials. In International Optical Design Conference 2010 [76521R] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7652). https://doi.org/10.1117/12.868343