Ray tracing in biaxial materials

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Algorithms for polarization ray tracing biaxial materials and calculating the directions of ray propagation and energy flow, the refractive indices, and the coupling coefficients for all four resultant reflected and transmitted rays are presented. Examples of polarization state maps, retardance maps and diattenuation maps are generated as a function of angle of incidence for comparing plane parallel plate systems with uniaxial and biaxial materials.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7652
DOIs
StatePublished - 2010
EventInternational Optical Design Conference 2010 - Jackson Hole, WY, United States
Duration: Jun 13 2010Jun 17 2010

Other

OtherInternational Optical Design Conference 2010
CountryUnited States
CityJackson Hole, WY
Period6/13/106/17/10

Fingerprint

Biaxial
Ray Tracing
Ray tracing
ray tracing
Half line
rays
Polarization
reflected waves
polarization
coupling coefficients
parallel plates
Refractive Index
Incidence
Refractive index
incidence
Propagation
refractivity
Angle
propagation
Coefficient

Keywords

  • biaxial materials
  • birefringent material
  • Polarization ray tracing

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Lam, W. S. T., Mcclain, S. C., Smith, G. A., & Chipman, R. A. (2010). Ray tracing in biaxial materials. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7652). [76521R] https://doi.org/10.1117/12.868343

Ray tracing in biaxial materials. / Lam, Wai Sze T; Mcclain, Stephen C; Smith, Gregory A; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7652 2010. 76521R.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lam, WST, Mcclain, SC, Smith, GA & Chipman, RA 2010, Ray tracing in biaxial materials. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7652, 76521R, International Optical Design Conference 2010, Jackson Hole, WY, United States, 6/13/10. https://doi.org/10.1117/12.868343
Lam WST, Mcclain SC, Smith GA, Chipman RA. Ray tracing in biaxial materials. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7652. 2010. 76521R https://doi.org/10.1117/12.868343
Lam, Wai Sze T ; Mcclain, Stephen C ; Smith, Gregory A ; Chipman, Russell A. / Ray tracing in biaxial materials. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7652 2010.
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