Reaction analysis in stripline circuits

Sutirtha Kabir, Steven L Dvorak, John L. Prince

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

In this paper, a full-wave layered-interconnect simulator (UA-FWLIS), which is capable of simulating EM effects in packaging-interconnect problems, is introduced. Standard integral-equation-based Method of Moment (MoM) techniques are employed in UA-FWLIS. However, instead of using standard time-consuming numerical integration techniques, we have analytically evaluated the MoM reaction elements, thereby greatly the computational efficiency of the simulator. This paper illustrates the application of the simulator by employing it in the studies of coupling in a stripline structure and S-parameters for an interconnect.

Original languageEnglish (US)
Pages (from-to)347-356
Number of pages10
JournalIEEE Transactions on Advanced Packaging
Volume24
Issue number3
DOIs
StatePublished - Aug 2001

Fingerprint

Simulators
Method of moments
Networks (circuits)
Strip telecommunication lines
Scattering parameters
Computational efficiency
Integral equations
Packaging

Keywords

  • Full-wave
  • Integral equation
  • Interconnects
  • Method of moments
  • Stripline

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Materials Science(all)

Cite this

Reaction analysis in stripline circuits. / Kabir, Sutirtha; Dvorak, Steven L; Prince, John L.

In: IEEE Transactions on Advanced Packaging, Vol. 24, No. 3, 08.2001, p. 347-356.

Research output: Contribution to journalArticle

Kabir, Sutirtha ; Dvorak, Steven L ; Prince, John L. / Reaction analysis in stripline circuits. In: IEEE Transactions on Advanced Packaging. 2001 ; Vol. 24, No. 3. pp. 347-356.
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