Read-noise characterization of focal plane array detectors via mean-variance analysis

R. P. Sperline, A. K. Knight, C. A. Gresham, D. W. Koppenaal, G. M. Hieftje, M Bonner Denton

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Mean-variance analysis is described as a method for characterization of the read-noise and gain of focal plane array (FPA) detectors, including charge-coupled devices (CCDs), charge-injection devices (CIDs), and complementary metal-oxide-semiconductor (CMOS) multiplexers (infrared arrays). Practical FPA detector characterization is outlined. The nondestructive readout capability available in some CIDs and FPA devices is discussed as a means for signal-to-noise ratio improvement. Derivations of the equations are fully presented to unify understanding of this method by the spectroscopic community.

Original languageEnglish (US)
Pages (from-to)1315-1323
Number of pages9
JournalApplied Spectroscopy
Volume59
Issue number11
DOIs
StatePublished - Nov 2005

Fingerprint

Focal plane arrays
focal plane devices
charge injection devices
Charge injection
Detectors
detectors
multiplexing
Charge coupled devices
readout
charge coupled devices
Signal to noise ratio
CMOS
signal to noise ratios
derivation
Metals
Infrared radiation

Keywords

  • CCD
  • Charge-coupled device
  • Charge-injection device
  • CID
  • CMOS multiplexer
  • Complementary metal-oxide-semiconductor multiplexer
  • Focal plane array
  • FPA
  • Mean-variance analysis
  • Poisson distribution

ASJC Scopus subject areas

  • Spectroscopy
  • Instrumentation

Cite this

Sperline, R. P., Knight, A. K., Gresham, C. A., Koppenaal, D. W., Hieftje, G. M., & Denton, M. B. (2005). Read-noise characterization of focal plane array detectors via mean-variance analysis. Applied Spectroscopy, 59(11), 1315-1323. https://doi.org/10.1366/000370205774783250

Read-noise characterization of focal plane array detectors via mean-variance analysis. / Sperline, R. P.; Knight, A. K.; Gresham, C. A.; Koppenaal, D. W.; Hieftje, G. M.; Denton, M Bonner.

In: Applied Spectroscopy, Vol. 59, No. 11, 11.2005, p. 1315-1323.

Research output: Contribution to journalArticle

Sperline, RP, Knight, AK, Gresham, CA, Koppenaal, DW, Hieftje, GM & Denton, MB 2005, 'Read-noise characterization of focal plane array detectors via mean-variance analysis', Applied Spectroscopy, vol. 59, no. 11, pp. 1315-1323. https://doi.org/10.1366/000370205774783250
Sperline, R. P. ; Knight, A. K. ; Gresham, C. A. ; Koppenaal, D. W. ; Hieftje, G. M. ; Denton, M Bonner. / Read-noise characterization of focal plane array detectors via mean-variance analysis. In: Applied Spectroscopy. 2005 ; Vol. 59, No. 11. pp. 1315-1323.
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