Read-noise characterization of focal plane array detectors via mean-variance analysis

R. P. Sperline, A. K. Knight, C. A. Gresham, D. W. Koppenaal, G. M. Hieftje, M Bonner Denton

Research output: Contribution to journalArticle

13 Scopus citations

Abstract

Mean-variance analysis is described as a method for characterization of the read-noise and gain of focal plane array (FPA) detectors, including charge-coupled devices (CCDs), charge-injection devices (CIDs), and complementary metal-oxide-semiconductor (CMOS) multiplexers (infrared arrays). Practical FPA detector characterization is outlined. The nondestructive readout capability available in some CIDs and FPA devices is discussed as a means for signal-to-noise ratio improvement. Derivations of the equations are fully presented to unify understanding of this method by the spectroscopic community.

Original languageEnglish (US)
Pages (from-to)1315-1323
Number of pages9
JournalApplied Spectroscopy
Volume59
Issue number11
DOIs
Publication statusPublished - Nov 2005

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Keywords

  • CCD
  • Charge-coupled device
  • Charge-injection device
  • CID
  • CMOS multiplexer
  • Complementary metal-oxide-semiconductor multiplexer
  • Focal plane array
  • FPA
  • Mean-variance analysis
  • Poisson distribution

ASJC Scopus subject areas

  • Spectroscopy
  • Instrumentation

Cite this

Sperline, R. P., Knight, A. K., Gresham, C. A., Koppenaal, D. W., Hieftje, G. M., & Denton, M. B. (2005). Read-noise characterization of focal plane array detectors via mean-variance analysis. Applied Spectroscopy, 59(11), 1315-1323. https://doi.org/10.1366/000370205774783250