Reappraisal of the validity of IEM model

T. D. Wu, K. S. Chen, A. K. Fung, Z. Su, P. Trouch, Rudi Hoeben, Marco Mancini

Research output: Contribution to conferencePaper

1 Scopus citations

Abstract

A surface scattering model based on the integral equation method is examined in terms of its applicability to laboratory measurements. The Fresnel reflection coefficients used in the model have been approximated as a function of the incident angle at low frequency and a function of the specular angle at high frequency. Based on a limited set of experimental measurements, a transition function are suggested for estimating the Fresnel reflection coefficients in the intermediate regions. Results of comparison indicate that the IEM is accurate and practical to use. Issue raised from dielectric information is also addressed.

Original languageEnglish (US)
Pages1365-1367
Number of pages3
StatePublished - Jan 1 1997
Externally publishedYes
EventProceedings of the 1997 IEEE International Geoscience and Remote Sensing Symposium, IGARSS'97. Part 3 (of 4) - Singapore, Singapore
Duration: Aug 3 1997Aug 8 1997

Other

OtherProceedings of the 1997 IEEE International Geoscience and Remote Sensing Symposium, IGARSS'97. Part 3 (of 4)
CitySingapore, Singapore
Period8/3/978/8/97

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ASJC Scopus subject areas

  • Computer Science Applications
  • Earth and Planetary Sciences(all)

Cite this

Wu, T. D., Chen, K. S., Fung, A. K., Su, Z., Trouch, P., Hoeben, R., & Mancini, M. (1997). Reappraisal of the validity of IEM model. 1365-1367. Paper presented at Proceedings of the 1997 IEEE International Geoscience and Remote Sensing Symposium, IGARSS'97. Part 3 (of 4), Singapore, Singapore, .