In this letter, we investigate fault-tolerance of memories built from unreliable cells. In order to increase thememory reliability, information is encoded by a low-density paritycheck (LDPC) code, and then stored. The memory content is updated periodically by the bit-flipping decoder, built also from unreliable logic gates, whose failures are transient and datadependent. Based on the expander property of Tanner graph of LDPC codes, we prove that the proposed memory architecture can tolerate a fixed fraction of component failures and consequently preserve all the stored information, if code length tends to infinity.
- Faulty bit-flipping decoding
- Low-density parity-check codes
- Reliable memory architecture
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Computer Science Applications
- Modeling and Simulation