Reliability quantification of electronics in the space environment

Zishan Wei, Barry D. Ganapol

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Space environment naturally can damage electronics through two failure mechanisms, totalionizing-dose and single-event effects (SEE). In this presentation, a reliability quantification method is proposed by considering both failure mechanisms, The reliability of an electronic device due to the first failure mechanism is defined as the probability of the cumulative effect of the particles greater than an allowable threshold. The reliability due to the second failure mechanisms is defined as the probability of a high-energy particle impacting the device and causing the hard failure of the electronics. The reliability of the entire device is obtained by using Baye's theory. A cascade model for the cumulative deposited energy of Galactic ions is presented. Finally, a comprehensive example is given to illustrate the usage of the proposed method.

Original languageEnglish (US)
Title of host publicationAmerican Nuclear Society Embedded Topical Meeting - 2005 Space Nuclear Conference
Pages626-634
Number of pages9
StatePublished - Nov 28 2005
EventAmerican Nuclear Society Embedded Topical Meeting - 2005 Space Nuclear Conference - San Diego, CA, United States
Duration: Jun 5 2005Jun 9 2005

Publication series

NameAmerican Nuclear Society Embedded Topical Meeting - 2005 Space Nuclear Conference

Other

OtherAmerican Nuclear Society Embedded Topical Meeting - 2005 Space Nuclear Conference
CountryUnited States
CitySan Diego, CA
Period6/5/056/9/05

ASJC Scopus subject areas

  • Engineering(all)

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    Wei, Z., & Ganapol, B. D. (2005). Reliability quantification of electronics in the space environment. In American Nuclear Society Embedded Topical Meeting - 2005 Space Nuclear Conference (pp. 626-634). (American Nuclear Society Embedded Topical Meeting - 2005 Space Nuclear Conference).