Remote attitude measurement via Doppler interferometer

David J. Wilson, Charles E. Craven, Donald R. Snyder, Mark F. Hopkins, Russell A. Chipman, Randall R. Hodgson

Research output: Contribution to journalConference article

Abstract

Pitch and yaw of objects moving at high velocities can be measured with a Doppler interferometer system employing corner cube retroreflectors mounted on the moving object. Measurement of pitch or yaw alone was demonstrated in laboratory and field experiments. Using the Jones calculus, the polarization considerations for measuring both pitch and yaw simultaneously have been analyzed.

Original languageEnglish (US)
Pages (from-to)503-517
Number of pages15
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1166
DOIs
StatePublished - Jan 25 1990
Externally publishedYes
EventPolarization Considerations for Optical Systems II 1989 - San Diego, United States
Duration: Aug 7 1989Aug 11 1989

Fingerprint

yaw
Doppler
Moving Objects
Interferometer
Interferometers
interferometers
Polarization
Field Experiment
Regular hexahedron
retroreflectors
Calculus
Experiments
calculus
polarization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Remote attitude measurement via Doppler interferometer. / Wilson, David J.; Craven, Charles E.; Snyder, Donald R.; Hopkins, Mark F.; Chipman, Russell A.; Hodgson, Randall R.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 1166, 25.01.1990, p. 503-517.

Research output: Contribution to journalConference article

Wilson, David J. ; Craven, Charles E. ; Snyder, Donald R. ; Hopkins, Mark F. ; Chipman, Russell A. ; Hodgson, Randall R. / Remote attitude measurement via Doppler interferometer. In: Proceedings of SPIE - The International Society for Optical Engineering. 1990 ; Vol. 1166. pp. 503-517.
@article{9891db4535c148ba81acff5d2dccde89,
title = "Remote attitude measurement via Doppler interferometer",
abstract = "Pitch and yaw of objects moving at high velocities can be measured with a Doppler interferometer system employing corner cube retroreflectors mounted on the moving object. Measurement of pitch or yaw alone was demonstrated in laboratory and field experiments. Using the Jones calculus, the polarization considerations for measuring both pitch and yaw simultaneously have been analyzed.",
author = "Wilson, {David J.} and Craven, {Charles E.} and Snyder, {Donald R.} and Hopkins, {Mark F.} and Chipman, {Russell A.} and Hodgson, {Randall R.}",
year = "1990",
month = "1",
day = "25",
doi = "10.1117/12.962922",
language = "English (US)",
volume = "1166",
pages = "503--517",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

TY - JOUR

T1 - Remote attitude measurement via Doppler interferometer

AU - Wilson, David J.

AU - Craven, Charles E.

AU - Snyder, Donald R.

AU - Hopkins, Mark F.

AU - Chipman, Russell A.

AU - Hodgson, Randall R.

PY - 1990/1/25

Y1 - 1990/1/25

N2 - Pitch and yaw of objects moving at high velocities can be measured with a Doppler interferometer system employing corner cube retroreflectors mounted on the moving object. Measurement of pitch or yaw alone was demonstrated in laboratory and field experiments. Using the Jones calculus, the polarization considerations for measuring both pitch and yaw simultaneously have been analyzed.

AB - Pitch and yaw of objects moving at high velocities can be measured with a Doppler interferometer system employing corner cube retroreflectors mounted on the moving object. Measurement of pitch or yaw alone was demonstrated in laboratory and field experiments. Using the Jones calculus, the polarization considerations for measuring both pitch and yaw simultaneously have been analyzed.

UR - http://www.scopus.com/inward/record.url?scp=85075445075&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85075445075&partnerID=8YFLogxK

U2 - 10.1117/12.962922

DO - 10.1117/12.962922

M3 - Conference article

AN - SCOPUS:85075445075

VL - 1166

SP - 503

EP - 517

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -