Review of Zernike polynomials and their use in describing the impact of misalignment in optical systems

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

The Zernike polynomials provide a generalized framework for analyzing the aberrations of non-rotationally symmetric optical systems with circular pupils. Even when systems are designed to be rotationally symmetric, fabrication and alignment errors will lead to non-rotationally symmetric aberrations. The properties of the Zernike polynomials are reviewed to illustrate their properties. Different indexing, normalization and ordering schemes are found in the literature and commercial software. He the schemes are compared to demonstrate some of the potential pitfalls of comparing Zernike polynomial results from different sources.

Original languageEnglish (US)
Title of host publicationOptical System Alignment, Tolerancing, and Verification XI
EditorsJose Sasian, Richard N. Youngworth
PublisherSPIE
ISBN (Electronic)9781510612112
DOIs
StatePublished - 2017
EventOptical System Alignment, Tolerancing, and Verification XI 2017 - San Diego, United States
Duration: Aug 6 2017Aug 7 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10377
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptical System Alignment, Tolerancing, and Verification XI 2017
CountryUnited States
CitySan Diego
Period8/6/178/7/17

Keywords

  • Zernike polynomials
  • aberrations
  • surface form
  • wavefront error

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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