Rigorous modeling of lateral leakage loss in SOI thin-ridge waveguides and couplers

Thach G. Nguyen, Ravi S. Tummidi, Thomas L. Koch, Arnan Mitchell

Research output: Contribution to journalArticle

44 Scopus citations

Abstract

The transverse-magnetic to transverse-electric (TM-TE) mode coupling properties and the lateral leakage loss behavior of the propagating TM-like mode in silicon-on-insulator thin-ridge waveguides and directional couplers are investigated. Accurate calculation of the lateral leakage is performed by a mode matching technique in which the calculation window is left fully open in the lateral direction.

Original languageEnglish (US)
Pages (from-to)486-488
Number of pages3
JournalIEEE Photonics Technology Letters
Volume21
Issue number7
DOIs
StatePublished - Apr 1 2009
Externally publishedYes

Keywords

  • Leaky waves
  • Optical losses
  • Optical waveguides
  • Silicon-on-insulator (SOI) technology

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Rigorous modeling of lateral leakage loss in SOI thin-ridge waveguides and couplers'. Together they form a unique fingerprint.

  • Cite this