Abstract
This paper introduces a novel sensor placement approach for dimensional inspection with active visual inspection systems. For a given set of entities, an effective sensor plan includes parameter values that allow some entities to be observed simultaneously. Two kinds of approaches have generally been used for sensor planning in visual inspection systems: the generate-and-test method and the synthesis method. In order to have high performance and satisfactory accuracy, uncertainty must be considered in the sensing model of the visual system. Furthermore, in order to avoid sharp deterioration of the performance of the visual inspection system for very small disturbances of the parameters, an appropriate definition of robustness is proposed. In an experiment a new sensor planning approach based on robustness resolves some problems with earlier approaches.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings - IEEE International Conference on Robotics and Automation |
| Publisher | IEEE |
| Pages | 2602-2607 |
| Number of pages | 6 |
| Volume | 4 |
| State | Published - 1999 |
| Externally published | Yes |
| Event | Proceedings of the 1999 IEEE International Conference on Robotics and Automation, ICRA99 - Detroit, MI, USA Duration: May 10 1999 → May 15 1999 |
Other
| Other | Proceedings of the 1999 IEEE International Conference on Robotics and Automation, ICRA99 |
|---|---|
| City | Detroit, MI, USA |
| Period | 5/10/99 → 5/15/99 |
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ASJC Scopus subject areas
- Software
- Control and Systems Engineering
Cite this
Robust approach for sensor placement in automated vision dimensional inspection. / Gu, Xiangrong; Marefat, Michael Mahmoud; Ciarallo, Frank W.
Proceedings - IEEE International Conference on Robotics and Automation. Vol. 4 IEEE, 1999. p. 2602-2607.Research output: Chapter in Book/Report/Conference proceeding › Chapter
}
TY - CHAP
T1 - Robust approach for sensor placement in automated vision dimensional inspection
AU - Gu, Xiangrong
AU - Marefat, Michael Mahmoud
AU - Ciarallo, Frank W.
PY - 1999
Y1 - 1999
N2 - This paper introduces a novel sensor placement approach for dimensional inspection with active visual inspection systems. For a given set of entities, an effective sensor plan includes parameter values that allow some entities to be observed simultaneously. Two kinds of approaches have generally been used for sensor planning in visual inspection systems: the generate-and-test method and the synthesis method. In order to have high performance and satisfactory accuracy, uncertainty must be considered in the sensing model of the visual system. Furthermore, in order to avoid sharp deterioration of the performance of the visual inspection system for very small disturbances of the parameters, an appropriate definition of robustness is proposed. In an experiment a new sensor planning approach based on robustness resolves some problems with earlier approaches.
AB - This paper introduces a novel sensor placement approach for dimensional inspection with active visual inspection systems. For a given set of entities, an effective sensor plan includes parameter values that allow some entities to be observed simultaneously. Two kinds of approaches have generally been used for sensor planning in visual inspection systems: the generate-and-test method and the synthesis method. In order to have high performance and satisfactory accuracy, uncertainty must be considered in the sensing model of the visual system. Furthermore, in order to avoid sharp deterioration of the performance of the visual inspection system for very small disturbances of the parameters, an appropriate definition of robustness is proposed. In an experiment a new sensor planning approach based on robustness resolves some problems with earlier approaches.
UR - http://www.scopus.com/inward/record.url?scp=0032675106&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0032675106&partnerID=8YFLogxK
M3 - Chapter
AN - SCOPUS:0032675106
VL - 4
SP - 2602
EP - 2607
BT - Proceedings - IEEE International Conference on Robotics and Automation
PB - IEEE
ER -