Scanning interferometric apertureless microscopy: Optical imaging at 10 angstrom resolution

Frederic Zenhausern, Y. Martin, H. K. Wickramasinghe

Research output: Contribution to journalArticle

540 Citations (Scopus)

Abstract

Interferometric near-field optical microscopy achieving a resolution of 10 angstroms is demonstrated. The scattered electric field variation caused by a vibrating probe tip in close proximity to a sample surface is measured by encoding it as a modulation in the optical phase of one arm of an interferometer. Unlike in regular near-field optical microscopes, where the contrast results from a weak source (or aperture) dipole interacting with the polarizability of the sample, the present form of imaging relies on a fundamentally different contrast mechanism: sensing the dipole-dipole coupling of two externally driven dipoles (the tip and sample dipoles) as their spacing is modulated.

Original languageEnglish (US)
Pages (from-to)1083-1085
Number of pages3
JournalScience
Volume269
Issue number5227
StatePublished - Aug 25 1995
Externally publishedYes

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Optical Imaging
Microscopy

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Cite this

Scanning interferometric apertureless microscopy : Optical imaging at 10 angstrom resolution. / Zenhausern, Frederic; Martin, Y.; Wickramasinghe, H. K.

In: Science, Vol. 269, No. 5227, 25.08.1995, p. 1083-1085.

Research output: Contribution to journalArticle

Zenhausern, F, Martin, Y & Wickramasinghe, HK 1995, 'Scanning interferometric apertureless microscopy: Optical imaging at 10 angstrom resolution', Science, vol. 269, no. 5227, pp. 1083-1085.
Zenhausern, Frederic ; Martin, Y. ; Wickramasinghe, H. K. / Scanning interferometric apertureless microscopy : Optical imaging at 10 angstrom resolution. In: Science. 1995 ; Vol. 269, No. 5227. pp. 1083-1085.
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