Scanning micro-X-ray fluorescence elemental mapping: A new tool for the study of laminated sediment records

T. M. Shanahan, Jonathan Overpeck, J. B. Hubeny, J. King, F. S. Hu, K. Hughen, G. Miller, J. Black

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

The utility of elemental mapping by scanning X-ray fluorescence (XRF) in the study of annual laminated sedimentary records was investigated on eight annually laminated sediment types. The examples were chosen to illustrate the potential of this approach in environments dominated by terrigenous, biological and chemical deposition. Individual laminae were identifiable in elemental maps of all sediment types and were enhanced through the use of data reduction techniques (e.g., principal components transformation). Laminae were least apparent in clastic dominated systems with no seasonal changes in sediment sources. In biologically dominated systems, element maps provided insights into the composition of the varve subcomponents, related to alternating terrigenous and biologically dominated seasonal periods of deposition. Chemically precipitated structures were more prevalent than expected from visual investigations alone and may provide an underutilized paleoenvironmental signature of changing limnological conditions. Elemental mapping offers a valuable tool for the study of laminated records that complements existing techniques (e.g., SEM, digital image analysis).

Original languageEnglish (US)
Article numberQ02016
JournalGeochemistry, Geophysics, Geosystems
Volume9
Issue number2
DOIs
StatePublished - Feb 2008

Fingerprint

X-ray fluorescence
Sediments
sediments
Fluorescence
Scanning
X rays
fluorescence
scanning
sediment
varve
x rays
data reduction
digital image
image analysis
complement
Image analysis
Data reduction
scanning electron microscopy
signatures
Scanning electron microscopy

Keywords

  • Lamination
  • Major elements
  • Micro-XRF scanner
  • Varve

ASJC Scopus subject areas

  • Geochemistry and Petrology
  • Geophysics

Cite this

Scanning micro-X-ray fluorescence elemental mapping : A new tool for the study of laminated sediment records. / Shanahan, T. M.; Overpeck, Jonathan; Hubeny, J. B.; King, J.; Hu, F. S.; Hughen, K.; Miller, G.; Black, J.

In: Geochemistry, Geophysics, Geosystems, Vol. 9, No. 2, Q02016, 02.2008.

Research output: Contribution to journalArticle

Shanahan, T. M. ; Overpeck, Jonathan ; Hubeny, J. B. ; King, J. ; Hu, F. S. ; Hughen, K. ; Miller, G. ; Black, J. / Scanning micro-X-ray fluorescence elemental mapping : A new tool for the study of laminated sediment records. In: Geochemistry, Geophysics, Geosystems. 2008 ; Vol. 9, No. 2.
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